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SPIRES-BOOKS: FIND KEYWORD CHARACTERIZATION AND EVALUATION OF MATERIALS *END*INIT* use /tmp/qspiwww.webspi1/10868.29 QRY 131.225.70.96 . find keyword characterization and evaluation of materials ( in books using www Cover
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Call number:9784431560364:ONLINE Show nearby items on shelf
Title:Electromagnetic Acoustic Transducers Noncontacting Ultrasonic Measurements using EMATs
Author(s): Masahiko Hirao
Date:2017
Edition:2nd ed. 2017
Size:1 online resource (XVI, 380 p. 287 illus., 44 illus. in color p.)
Contents:Introduction -- Coupling mechanism -- Available EMATS -- Brief instruction to build EMATS -- Principles of EMAR for spectral response -- Free-Decay measurement for attenuation and internal friction -- In-SITU monitoring of dislocation
mobility -- Elastic constants and internal friction of advances materials -- Resonance Ultrasound microscopy -- Nonlinear acoustics for Microstractural evolution -- On-line texturer monitoring of steel sheets -- Acoustoelastic stress
measurements -- Measurement of induction-hardening depth -- Detection of flaw and corrosion -- Average grain size of steel -- Remaining-life assessment of fatigued metals -- Creep damage detection -- Field applications of EMATS
ISBN:9784431560364
Series:eBooks
Series:Springer eBooks
Series:Springer 2017 package
Keywords: Physics , Acoustics , Electronic circuits , Acoustical engineering , Materials science , Physics , Electronic Circuits and Devices , Characterization and Evaluation of Materials , Acoustics , Engineering Acoustics
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Call number:9783662532270:ONLINE Show nearby items on shelf
Title:Resonant X-Ray Scattering in Correlated Systems
Author(s):
Date:2017
Size:1 online resource (VII, 241 p. 151 illus., 25 illus. in color p.)
Contents:Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara) -- Resonant X-ray scattering in 3d electron systems (H. Nakao) -- Observation of multipole orderings in f-electron systems by
resonant x-ray diffraction (T. Matsumura) -- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima) -- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati) -- Resonant inelastic x-ray scattering in
strongly correlated copper oxides (K. Ishii)
ISBN:9783662532270
Series:eBooks
Series:Springer eBooks
Series:Springer 2017 package
Keywords: Physics , Condensed matter , Spectroscopy , Microscopy , Nanotechnology , Materials science , Physics , Condensed Matter Physics , Characterization and Evaluation of Materials , Spectroscopy and Microscopy , Nanotechnology and Microengineering
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Call number:9783662532249:ONLINE Show nearby items on shelf
Title:Computational Multiscale Modeling of Fluids and Solids Theory and Applications
Author(s): Martin Oliver Steinhauser
Date:2017
Edition:2nd ed. 2017
Size:1 online resource (XXIII, 405 p. 139 illus., 34 illus. in color p.)
Contents:Part I Fundamentals -- Introduction -- Multiscale Computational Materials Science -- Mathematical and Physical Prerequisites -- Fundamentals of Numerical Simulation -- Part II Computational Methods on Multiscales -- Summary of Part I
-- Computational Methods on Electronic/Atomistic Scale -- Computational Methods on Atomistic/Microscopic Scale -- Computational Methods on Microscopic/Mesoscopic Scale -- Perspectives in Multiscale Materials Modeling -- Further Reading
-- Mathematical Definitions -- Sample code for the main routine of a MD simulation -- A Sample Makefile -- Tables of Physical Constants -- List of Algorithms -- Selected Solutions
ISBN:9783662532249
Series:eBooks
Series:Springer eBooks
Series:Springer 2017 package
Keywords: Physics , Computer mathematics , Geophysics , Applied mathematics , Engineering mathematics , Materials science , Physics , Numerical and Computational Physics, Simulation , Characterization and Evaluation of Materials , Computational Mathematics and Numerical Analysis , Appl.Mathematics/Computational Methods of Engineering , Geophysics and Environmental Physics
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Call number:9783319483023:ONLINE Show nearby items on shelf
Title:Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms
Author(s): Jozef Veselý
Date:2017
Size:1 online resource (XIV, 100 p. 86 illus., 21 illus. in color p.)
Contents:Introduction -- Iron-Rich Iron Aluminides -- Experimental Methods -- Results -- Discussion -- Summary.
ISBN:9783319483023
Series:eBooks
Series:Springer eBooks
Series:Springer 2017 package
Keywords: Physics , Condensed matter , Spectroscopy , Microscopy , Materials science , Physics , Spectroscopy and Microscopy , Characterization and Evaluation of Materials , Condensed Matter Physics , Numerical and Computational Physics, Simulation
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Call number:9783319474922:ONLINE Show nearby items on shelf
Title:Transport of Energetic Electrons in Solids Computer Simulation with Applications to Materials Analysis and Characterization
Author(s): Maurizio Dapor
Date:2017
Edition:2nd ed. 2017
Size:1 online resource (XVIII, 182 p. 58 illus p.)
Contents:Electron Transport in Solids -- Cross-Sections: Basic Aspects -- Scattering Mechanisms -- Random Numbers -- Monte Carlo Strategies -- Backscattering Coefficient -- Secondary Electron Yield -- Electron Energy Distributions --
Applications
ISBN:9783319474922
Series:eBooks
Series:Springer eBooks
Series:Springer 2017 package
Keywords: Physics , Solid state physics , Applied mathematics , Engineering mathematics , Materials science , Physics , Solid State Physics , Numerical and Computational Physics, Simulation , Characterization and Evaluation of Materials , Appl.Mathematics/Computational Methods of Engineering
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Call number:9783319466019:ONLINE Show nearby items on shelf
Title:3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM) Proceedings, Oludeniz, Turkey, 19-23 October 2015
Author(s):
Date:2017
Size:1 online resource (XX, 255 p. 147 illus., 92 illus. in color p.)
Contents:Structural Analysis of Long Single-Stranded RNA Molecules with Atomic Force Microscopy Imaging -- Recombinant Fluorescent Ligand of Potassium Kv1.1 and Kv1.3 Channels: Design, Properties and Applications -- Single-Particle FRET
Microscopy of Immobilized Nucleosomes: Technique Development -- Post Embryonic Changes in the Eye of an Economic Mango Plant Pest Amritodus Atkinsoni Leth. (Hemiptera : Cicadellidae) -- Elemental Analysis of Various Feathers of Indian
Rose Ringed Parakeet Psittacula Krameri -- Interaction of Innate Immunity Cells with Composite Calcium Phosphate Coatings on Magnesium Alloy -- PNIPA Microgel and Alcian Blue Dye Aqueous Solution İnteraction (Microscopic İnvestigation)
-- Biofungicides in Nursery Production -- Cells shrinkage and Phosphatidylserine Externalization in Post Mortem Muscle by Fluorescence Microscopy
ISBN:9783319466019
Series:eBooks
Series:Springer eBooks
Series:Springer 2017 package
Keywords: Physics , Spectroscopy , Microscopy , Materials science , Physics , Spectroscopy and Microscopy , Spectroscopy/Spectrometry , Biological Microscopy , Characterization and Evaluation of Materials , Biological and Medical Physics, Biophysics
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Call number:9783319455228:ONLINE Show nearby items on shelf
Title:Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering
Author(s): Paul Lecoq
Date:2017
Edition:2nd ed. 2017
Size:1 online resource (XVI, 408 p. 226 illus., 44 illus. in color p.)
Contents:Preface to the Second edition -- Preface to the First Edition -- Scintillation and Inorganic Scintillators -- How User’s Requirements Influence the Development of Scintillators -- Addressing the Increased Demand for Fast Timing --
Scintillation Mechanisms in Inorganic Scintillators -- Energy Resolution and Non-proportionality of Scintillators -- Influence of the Crystal Structure Defects on Scintillation Properties -- Charged Hadron Radiation Damage of
Scintillators -- Crystal Engineering -- Examples of Recent Crystal Development -- Conclusion -- Index
ISBN:9783319455228
Series:eBooks
Series:Springer eBooks
Series:Springer 2017 package
Keywords: Physics , Nuclear medicine , Particle acceleration , Physical measurements , Measurement , Engineering , Materials science , Physics , Particle Acceleration and Detection, Beam Physics , Measurement Science and Instrumentation , Materials Engineering , Crystallography and Scattering Methods , Characterization and Evaluation of Materials , Nuclear Medicine
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Call number:9781608075355:ONLINE Show nearby items on shelf
Title:Microstrip lines and slotlines
Author(s): Ramesh Garg
I. J. Bahl
Maurizio Bozzi
Date:2013
Edition:Third edition.
Publisher:Artech House
Size:1 online resource (589 p.)
Contents:Chapter 1 Microstrip Lines I - Quasi-Static Analyses, Dispersion Models, and Measurements -- Planar Transmission Structures -- Microstrip Field Configuration -- Methods of Microstrip Analysis Quasi-Static Analyses of a Microstrip -- Modified Conformal Transformation Method -- Finite Difference Method -- Integral Equation Meth od -- Variational Method in the Fourier Transform Domain -- Segmentation and Boundary Element Method -- Microstrip Dispersion Models -- Coupled TEM Mode and TM Mode Model -- An Empirical Relation -- Dielectric-Loaded Ridged Waveguide Model -- Empirical F ormulae for Broad Frequency Range -- Planar Waveguide Model -- Microstrip Transitions -- Coaxial-to-Microstrip Transition -- Waveguide-to-Microstrip Transition -- Microstrip Measurements -- Substrate Dielectric Constant -- Characteristic Impendance -- Pha se Velocity or Effective Dielectric Constant -- Attenuation Constant -- Fabrication -- Printed Circuit Technologies -- Hybrid Microwave Integrated Circuits -- Monolithic Integrated Circuit Technologies
Chapter 2 Microstrip Lines II -- Fullwave Analyses, Design Considerations, and Applications -- Methods of Fullwave Analysis -- Analysis of an Open Microstrip -- Integral Equation Method in the Space Domain -- Galerkin.s Method in the Spectral Domain -- Analysis of an Enclosed Microstrip -- Integral Equation Methods -- Finite Difference Method -- Design Considerations -- Microstrip Losses -- Power Handling Capability -- Effect of Tolerances -- Effect of Dielectric Anisotropy -- Frequency Range of Ope ration -- Lumped Element Model of Microstrip Interconnect -- Other Types of Microstrip Lines -- Suspended and Inverted Microstrip Lines -- Multilayered Dielectric Microstrip -- Thin Film Microstrip -- Valley Microstrip Lines -- Buried Microstrip Line -- S uperconducting Microstrip Circuits -- Microstrip Applications -- Lumped Elements -- Passive Components -- Active Components -- Packages and Assemblies
Chapter 3 Microstrip Discontinuities I -- Quasi-Static Analysis and Characterization -- Discontinui ty Capacitance Evaluation -- Matrix Inversion Method -- Variational Method -- Galerkins Method in the Fourier Transform Domain -- Use of Line Sources with Charge Reversal -- Discontinuity Inductance Evaluation -- Characterization of Various Discontinuitie s -- Open Ends -- Gaps in a Microstrip -- T-Junctions -- Cross Junctions -- RF Short and Via Hole -- Compensated Microstrip Discontinuities
Chapter 4 Microstrip Discontinuities II: Fullwave Analysis and Measurements -- Planar Waveguide Analysis -- Discontinuity Characterization -- Compensation of Discontinuity Reactances -- Radiation and Parasitic Coupling -- Fullwave Analysis of Discon tinuities . Galerkins Method in the Spectral Domain -- Integral Equation Solution in the Space Domain -- Time Domain Methods for Microstrip Discontinuity -- Discontinuity Measurements -- Linear Resonator Method -- Ring Resonator Method -- Scattering Param eters Measurement Method
Chapter 5 Slotlines -- Slotline Analysis -- Approximate Analysis -- Transverse Resonance Method . Galerkins Method in the Spectral Domain -- Design Considerations -- Closed-Form Expressions -- Effect of Metal Thickness -- Effec t of Tolerances -- Losses in Slotline -- Slotline Discontinuities -- Short End Discontinuty -- Open End Discontinuity -- Variants of Slotline -- Coupled Microstrip-Slotline -- Conductor-Backed Slotline -- Conductor-Backed Slotline with Superstrate -- Slot lines with Double-Layered Dielectric -- Slotline Transitions -- Coaxial-to-Slotline Transition -- Microstrip-to-Slotline Cross-Junction Transition -- Slotline Applications -- Circuits Using T-Junctions -- Circuits Using Wideband 180 Phase Shift -- Hybrid /de Ronde.s Branchline Couplers
Chapter 6 Defected Ground Structure (DGS) -- Basic Structure of DGS -- Unit Cell and Periodic DGS -- Advantages and Disadvantages of DGS -- DGS Characteristics -- Stop-Band Properties -- Slow-Wave Propagation -- Realization of Transmission Lines wit h High Characteristic Impedance -- Modeling of DGS -- Full-Wave Modeling -- Equivalent Circuit Models -- Applications of DGS -- DGS-Based Filters -- Other DGS-Based Passive Components -- DGS-Based Active Circuits -- DGS-Based Antennas
Chapter 7 Coplan ar Lines: Coplanar Waveguide and Coplanar Strips -- Quasi-Static Conformal Mapping Analysis of CPW -- Quasi-Static Conformal Mapping Analysis of CPS -- Fullwave Analysis -- Design Considerations -- Design Equations -- Dispersion -- Effect of Metallization Thickness -- Losses in Coplanar Lines -- Dielectric Loss -- Conductor Loss -- Radiation and Surface Wave Losses -- Effect of Tolerances -- Comparison with Microstrip Line and Slotline -- Transitions -- Coax-to-CPW Transitions -- Microstrip-to-CPS Transit ions -- Microstrip-to-CPW Transition -- CPW-to-CPS Transitions -- CPS-to-Slotline Transitions -- Slotline-to-CPW Transitions -- Discontinuities in Coplanar Lines -- CAD Models for Discontinuities in Coplanar Waveguide Circuits -- CAD Models for Discontinu ities in Coplanar Strips Circuits -- Coplanar Line Circuits -- Circuits with Series and Shunt Reactances in CPW -- Circuits Using Slotline-CPW Junctions
Chapter 8 Coupled Microstrip Lines -- General Analysis of Coupled Lines -- Methods of Analysis -- Coupled Mode Approach -- Even- and Odd-Mode Approach -- Characteristics of Coupled Microstrip Lines -- Quasi-Static Analysis -- Fullwave Analysis -- Di spersion Models -- Measurements on Coupled Microstrip Lines -- Impedance Measurements -- Phase Constant Measurements -- Design Considerations for Coupled Microstrip Lines -- Design Equations -- Effect of Fabrication Tolerances -- Coupled Microstrip Lines with Dielectric Overlays -- Effect of Dielectric Anisotropy -- Slot-Coupled Microstrip Lines -- Coupled Multiconductor Microstrip Lines -- Discontinuities in Coupled Microstrip Lines -- Network Model -- Open-End Discontinuity
Chapter 9 Substrate Integrated Waveguide (SIW) -- Operation Principle -- Analysis Techniques of SIW . Equivalent Rectangular Waveguide -- Full-wave Modeling of SIW Interconnects -- Full-wave Modeling of SIW Components -- Equivalent Circuits Models o f SIW Discontinuities -- Design Considerations -- Mechanisms of Loss -- Guided.wave and Leaky-wave Regions of Operation -- Band-gap Effects in SIW Structures -- SIW Design Rules -- Substrate Integrated Folded Waveguide (SIFW) -- Half-Mode Substrate Integr ated Waveguide (HMSIW) -- Substrate Integrated Slab Waveguide (SISW) -- Substrate Integrated Ridge Waveguide (SIRW) -- Transitions Between SIW and Planar Transmission Lines -- Microstrip-to-SIW Transitions -- CPW-to-SIW Transitions -- SIW Components and A ntennas -- Passive Components -- Active Circuits -- Antennas -- System-on-Substrate (SoS) -- Fabrication Technologies and Materials -- Fabrication by PCB and LTCC Technologies -- Integration of SIW on Silicon -- Use of Novel Substrate Materials -- Solutio ns for High Frequency Operation of SIW
ISBN:9781608075355
Series:eBooks
Series:Artech eBooks
Keywords: Strip transmission lines. , Microwave transmission lines. , Microwave integrated circuits.
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Call number:SPRINGER-2016-9789811005787:ONLINE Show nearby items on shelf
Title:New Technologies in Electromagnetic Non-destructive Testing
Author(s): Songling Huang
Date:2016
Edition:1st ed. 2016
Size:1 online resource (146 p.)
Note:10.1007/978-981-10-0578-7
Contents:Electromagnetic ultrasonic guided wave testing -- Outline -- Factors influencing the performance of EMATs -- EMATs for pipeline axial guided wave generation -- The dispersion characteristic of the guided waves -- The electromagnetic
ultrasonic guided wave testing technology -- Pulsed eddy current testing -- Basic principle of electromagnetism -- The coil type probe for the pulsed eddy current testing -- The electronic circuit used in the pulsed eddy current
testing -- The remote field eddy current testing -- The mathematical model of the remote field eddy current testing -- The finite element simulation and modeling of the remote field eddy current in the pipeline -- The 2D finite element
simulation of the remote field eddy current in the pipeline -- The 3D finite element simulation of the remote field eddy current in the pipeline -- Low frequency eddy current testing -- The low frequency eddy current-based testing
system of the pipeline deformation -- The metal magnetic memory testing -- The principle of testing -- The relation between the magnetic field of the earth and the magnetic memory of the ferromagnetic materials -- Measuring the
distribution of the stress using the metal magnetic memory -- The magnetic flux leakage testing -- The principle of the MFL testing -- The factors influencing the MFL testing -- The defect size quantification methods in the MFL testing
-- The pulsed MFL testing -- References
ISBN:9789811005787
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Magnetism , Magnetic materials , Electronic circuits , Physical measurements , Measurement , Structural mechanics , Materials science , Physics , Electronic Circuits and Devices , Characterization and Evaluation of Materials , Measurement Science and Instrumentation , Magnetism, Magnetic Materials , Structural Mechanics
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Call number:SPRINGER-2016-9789811005640:ONLINE Show nearby items on shelf
Title:Electromagnetic Ultrasonic Guided Waves
Author(s): Songling Huang
Date:2016
Edition:1st ed. 2016
Size:1 online resource (301 p.)
Note:10.1007/978-981-10-0564-0
Contents:Electromagnetic acoustic transducer -- Analytical method of EMAT based on Lorentz force mechanization -- Analytical method of EMAT based on a magnetostrictive mechanism -- The propagation characteristics of a circumferential
ultrasonic guided wave in plate and pipe -- Simulation of interactions between guided waves and the defects by boundary element method -- Finite element simulation of ultrasonic guided waves -- Applications of the electromagnetic
ultrasonic guided waves technique
ISBN:9789811005640
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Acoustics , Physical measurements , Measurement , Acoustical engineering , Engineering , Materials science , Physics , Measurement Science and Instrumentation , Engineering Acoustics , Characterization and Evaluation of Materials , Acoustics , Materials Engineering
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Call number:SPRINGER-2016-9783319395319:ONLINE Show nearby items on shelf
Title:Metrology and Physical Mechanisms in New Generation Ionic Devices
Author(s): Umberto Celano
Date:2016
Size:1 online resource (18 p.)
Note:10.1007/978-3-319-39531-9
Contents:Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM
-- Conclusions and Outlook.
ISBN:9783319395319
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Spectroscopy , Microscopy , Nanotechnology , Materials science , Physics , Spectroscopy and Microscopy , Nanotechnology and Microengineering , Characterization and Evaluation of Materials
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Call number:SPRINGER-2016-9783319297316:ONLINE Show nearby items on shelf
Title:Analytical Methods for Nonproliferation
Author(s): Edward C Morse
Date:2016
Size:1 online resource (100 p.)
Note:10.1007/978-3-319-29731-6
Contents:Introduction -- Nuclear Proliferation -- The Threat of Nuclear Terrorism -- Interdiction of Nuclear Material -- 2. Nuclear Explosives -- History -- Device Physics -- Special Nuclear Material -- 3. Signatures and Background --
Simplified Transport Calculations -- The Radiation Background -- Problems -- 4. Detection Statistics -- Classical and Bayesian Statistics -- Counting Statistics -- Confusion Matrices -- Receiver Operating Characteristics -- Application
of Bayesian Statistical Methods -- Pulse Shape Discrimination as an Example of Binary Classification -- Problems -- 5. The Nuclear Fuel Cycle -- Mining and Chemical Processing of Uranium -- UF6 Conversion and Enrichment -- Post-Reactor
-- Conversion of Military Materials -- Waste Management -- Enrichment Technologies -- Reactors and Proliferation -- Problems -- 6. Nuclear Forensics -- Introduction -- Attribution Methods -- Analysis Tools -- Problems -- 7. Nuclear
Testing -- Introduction and History -- The Comprehensive Test Ban Treaty and the International Monitoring System -- Radionuclide Monitoring -- Seismic Signals -- Hydroacoustic Monitoring -- Infrasonic Signatures -- Concluding Remarks
-- Problems -- 8. Active Interrogation -- Introduction -- Neutron Active Interrogation -- Photofission -- Nuclear Resonance Fluorescence -- Dose Considerations -- 9. Advanced Detection Technologies -- Introduction -- Advanced
Scintillator Materials -- Advanced Semiconductor Detectors -- Alternatives to 3HE -- Imaging Detectors -- Concluding Remarks -- Problems -- 10 -- Arms Control and Treaty Verification -- Introduction -- Neutron Multiplicity Counting --
Pu300, Pu600, and Pu900 Methods -- Neutron Imaging -- Neutrino Methods -- Concluding Remarks -- Problems -- 11. Public Policy and Proliferation -- Introduction -- The International Atomic Energy Agency (IAEA) -- Nuclear
Nonproliferation Activities within the US Government -- Non-Governmental Organizations (NGOs) -- A The Treaty on the Non-Proliferation of Nuclear Weapons -- The Atomic Energy Act -- The Area under the ROC Curve for Gaussian Probability
Distributions -- Index.
ISBN:9783319297316
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Nuclear energy , Nuclear physics , Physical measurements , Measurement , System safety , Nuclear engineering , Materials science , Physics , Measurement Science and Instrumentation , Nuclear Energy , Characterization and Evaluation of Materials , Nuclear Engineering , Security Science and Technology , Particle and Nuclear Physics
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Call number:SPRINGER-2016-9783319195544:ONLINE Show nearby items on shelf
Title:Computer Simulation Tools for X-ray Analysis Scattering and Diffraction Methods
Author(s): Sérgio Luiz Morelhão
Date:2016
Size:1 online resource (104 p.)
Note:10.1007/978-3-319-19554-4
Contents:Radiation-electron (free electron) elementary interaction -- Scattering of X-rays by distributions of free electrons -- Atoms and molecules -- X-ray absorption -- Low correlated systems: gases and dilute solutions -- Complex systems
I: short-range correlations -- Complex systems II: arbitrary long-range correlations -- Crystals -- Application of kinematic diffraction -- Introduction to dynamical diffraction
ISBN:9783319195544
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Physical chemistry , Crystallography , Materials science , Physics , Crystallography , Characterization and Evaluation of Materials , Physical Chemistry , Numerical and Computational Physics
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Call number:SPRINGER-2016-9783319143941:ONLINE Show nearby items on shelf
Title:Synchrotron Light Sources and Free-Electron Lasers Accelerator Physics, Instrumentation and Science Applications
Author(s):
Date:2016
Edition:1st ed. 2016
Size:1 online resource (632 p.)
Note:10.1007/978-3-319-14394-1
Contents:Accelerator Physics -- Physics of Synchrotron Radiation -- Introduction to High-Gain FEL Theory -- Seeding the Harmonic Generation in Free Electron Lasers -- Ultrashort Pulses from Synchrotron Radiation Sources -- Terahertz Radiation
Sources -- Facility Design -- Storage Ring Design for Synchrotron Radiation Sources -- Electron Linear Accelerator for X-Ray FEL -- The SCALA FEL -- FLASH: The First Superconducting X-Ray FEL -- Energy Recovery Linacs -- Technology
Basis -- Integrated Multi-Magnet Systems -- Superconduction RF: Enabling Technology for Modern Light Sources -- Vacuum Systems for Synchrotron Light Sources and FELs -- Electron Sources for Brilliant Light Sources -- Shaping Photon
Beams with Undulators and Wigglers -- Control Systems, Operational Tools -- Beam Instrumentation and Diagnostics -- Orbit/Trajectory Control and Feedback -- Beam Instabilities, Feedback Systems -- Brilliant Light Sources Driven by
Laser-Plasma Accelerators
ISBN:9783319143941
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Physical chemistry , Optics , Electrodynamics , Condensed matter , Biophysics , Biological physics , Physical measurements , Measurement , Materials science , Physics , Optics and Electrodynamics , Characterization and Evaluation of Materials , Condensed Matter Physics , Measurement Science and Instrumentation , Physical Chemistry , Biophysics and Biological Physics
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Call number:SPRINGER-2014-9783642405945:ONLINE Show nearby items on shelf
Title:Frontiers in Optical Methods [electronic resource] : Nano-Characterization and Coherent Control
Author(s): Ken-ichi Shudo
Ikufumui Katayama
Shin-Ya Ohno
Date:2014
Publisher:Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer
Size:1 online resource
Note:This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-rayphotonics. Several relate d areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal ofthe Vacuum Society of Japan
Contents:State
of
Art of Terahertz Science and Technology
Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films
Single Photon Counting and Passive Microscopy of Terahertz Radiation
Coherent Phonons in Carbon Nanotubes
Time
resolved X
ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation
Imaging GHz
THz Acoustic Wave Propagation in Thin Films and Microstructures
Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy
Ultrafast Excitation and Dynamics Measurements with Intense Ult
ISBN:9783642405945
Series:eBooks
Series:SpringerLink
Series:Springer Series in Optical Sciences, 0342-4111 : v180
Series:Physics and Astronomy (Springer-11651)
Keywords: Microwaves , Nanotechnology
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Call number:SPRINGER-2013-9781461443377:ONLINE Show nearby items on shelf
Title:Materials and Reliability Handbook for Semiconductor Optical and Electron Devices [electronic resource]
Author(s): Osamu Ueda
Stephen J Pearton
Date:2013
Publisher:New York, NY : Springer New York : Imprint: Springer
Size:1 online resource
Note:Springer e-book platform
Note:Springer 2013 e-book collections
Note:Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speedelectronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have reliedon extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activationenergy processes that are masked by other mechanisms at high temp erature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electroniccharacterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbookemphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.Provides the first handbook to cover all aspects of compound semiconductor device reliability Systematically describes research results on r eliability and materials issues of both optical and electron devices developed since 2000Covers characterization techniques needed to understand failure mechanisms in compound semiconductor devices Includes experimental approaches in reliability studies P resents case studies of laser degradation and HEMT degradation
Note:Springer eBooks
Contents:Preface
Part 1. Materials Issues and Reliability of Optical Devices
1. Reliability Testing of Semiconductor Optical Devices
2. Failure Analysis of Semiconductor Optical Devices
3. Failure Analysis using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
4. Reliability and Degradation of III
V Optical Devices Focusing on Gradual Degradation
5. Catastrophic Optical
damage in High Power, Broad
Area Laser
diodes
6. Reliability and Degradation of Vertical Cavity Surface Emitting Lasers
7. Structural Defects in GaN
based Materials and Their Re
ISBN:9781461443377
Series:e-books
Series:SpringerLink (Online service)
Series:Physics and Astronomy (Springer-11651)
Keywords: Electronics , Optical materials , Surfaces (Physics)
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Call number:SPRINGER-2012-9789400755796:ONLINE Show nearby items on shelf
Title:Uniting Electron Crystallography and Powder Diffraction [electronic resource]
Author(s): Ute Kolb
Kenneth Shankland
Louisa Meshi
Anatoly Avilov
William I.F David
Date:2012
Publisher:Springer Netherlands
Size:1 online resource
Note:Proceedings
Note:Springer 2012 Physics and Astronomy eBook collection
Note:Springer e-book platform
ISBN:9789400755796
Series:NATO Science for Peace and Security Series B: Physics and Biophysics
Series:e-books
Keywords: Crystallography , Characterization and Evaluation of Materials , Materials Science, general
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Call number:SPRINGER-2012-9783642234118:ONLINE Show nearby items on shelf
Title:Mass Metrology [electronic resource]
Author(s): S. V. Gupta
Date:2012
Publisher:Springer Berlin Heidelberg
Size:1 online resource
Note:Monograph
Note:Springer 2012 Physics and Astronomy eBook collection
Note:Springer e-book platform
ISBN:9783642234118
Series:Springer Series in Materials Science
Series:e-books
Keywords: Measurement Science and Instrumentation , Characterization and Evaluation of Materials , Theoretical and Applied Mechanics
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Call number:SPRINGER-2012-9783642222146:ONLINE Show nearby items on shelf
Title:Handbook of Spectral Lines in Diamond [electronic resource]
Author(s): Bernhard Dischler
Date:2012
Publisher:Springer Berlin Heidelberg
Size:1 online resource
Note:Handbook
Note:Springer 2012 Physics and Astronomy eBook collection
Note:Springer e-book platform
ISBN:9783642222146
Series:e-books
Keywords: Spectroscopy and Microscopy , Optics, Optoelectronics, Plasmonics and Optical Devices , Characterization and Evaluation of Materials , Optical and Electronic Materials , Microwaves, RF and Optical Engineering
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Call number:SPRINGER-2012-9783642206672:ONLINE Show nearby items on shelf
Title:Laser-Induced Breakdown Spectroscopy [electronic resource]
Author(s): Reinhard Noll
Date:2012
Publisher:Springer Berlin Heidelberg
Size:1 online resource
Note:Monograph
Note:Springer 2012 Physics and Astronomy eBook collection
Note:Springer e-book platform
ISBN:9783642206672
Series:e-books
Keywords: Spectroscopy and Microscopy , Atoms and Molecules in Strong Fields, Laser Matter Interaction , Characterization and Evaluation of Materials , Manufacturing, Machines, Tools
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Call number:SPRINGER-2012-9783642113482:ONLINE Show nearby items on shelf
Title:Modern Thermodynamics [electronic resource]
Author(s): Jitao Wang
Date:2012
Publisher:Springer Berlin Heidelberg
Size:1 online resource
Note:Monograph
Note:Springer 2012 Physics and Astronomy eBook collection
Note:Springer e-book platform
ISBN:9783642113482
Series:e-books
Keywords: Thermodynamics , Physical Chemistry , Characterization and Evaluation of Materials , Theoretical and Computational Chemistry , Statistical Physics, Dynamical Systems and Complexity
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Call number:SPRINGER-2005-9783540279228:ONLINE Show nearby items on shelf
Title:Lifetime Spectroscopy [electronic resource] : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Author(s): Stefan Rein
Date:2005
Publisher:Berlin, Heidelberg : Springer Berlin Heidelberg
Size:1 online resource
Note:Springer e-book platform
Note:Springer 2013 e-book collections
Note:Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely thosedefects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetimespectroscopic techniques. The various theoretical pr edictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explainedhere, confirms the excellent performance of lifetime spectroscopy
Note:Springer eBooks
Contents:Theory of carrier lifetime in silicon
Lifetime measurement techniques
Theory of lifetime spectroscopy
Defect characterization on intentionally metal
contaminated silicon samples
The metastable defect in boron
doped Czochralski silicon
Summary and further work
Zusammenfassung und Ausblick
ISBN:9783540279228
Series:e-books
Series:SpringerLink (Online service)
Series:Springer Series in Material Science, 0933-033X : v85
Series:Physics and Astronomy (Springer-11651)
Keywords: Particles (Nuclear physics) , Optical materials
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Call number:SPRINGER-2004-9789400710139:ONLINE Show nearby items on shelf
Title:Micromechanics and Nanoscale Effects MEMS, Multi-Scale Matrials and Micro-Flows
Author(s):
Date:2004
Size:1 online resource (240 p.)
Note:10.1007/978-94-007-1013-9
Contents:I: Micromechanics of MEMS Materials and Micro-flows -- 1 Experimental Mechanics of MEMS and Thin Films -- 2 Deformation of Composite Micro-Rods: Nanostructured Interphases and Multi-Scale Hierarchy -- 3 Electrostatics in MEMS and NEMS
-- 4 Electrokinetic Transport Phenomena in Micro-Fluidics -- II: Multi-Scale Modeling of Materials and Particulate Flows -- 5 Efficient Multigrid Methods for Materials Processing Flows with Small Particles -- 6 Probabilistic
Multi-Scale Modeling of Materials -- 7 From Lattices and Composites to Micropolar Continua -- 8 Dissipative Particle Dynamics and Other Fluid Particle Models
ISBN:9789400710139
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:ICASE/LaRC Interdisciplinary Series in Science and Engineering: 10
Keywords: Materials science , Mechanics , Condensed matter , Mechanical engineering , Biomedical engineering , Materials Science , Characterization and Evaluation of Materials , Mechanics , Mechanical Engineering , Condensed Matter Physics , Biomedical Engineering
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Call number:SPRINGER-2004-9783662108277:ONLINE Show nearby items on shelf
Title:Wafer Bonding Applications and Technology
Author(s):
Date:2004
Size:1 online resource (20 p.)
Note:10.1007/978-3-662-10827-7
Contents:1 Direct Bonding, Fusion Bonding, Anodic Bonding, Wafer Bonding: A Historical Patent Picture of the Worldwide Moving Front of the State-of-the-Art of Contact Bonding -- 2 Basics of Silicon-on-Insulator (SOI) Technology -- 3
Silicon-on-Insulator by the Smart CutTM Process -- 4 ELTRAN® Technology Based on Wafer Bonding and Porous Silicon -- 5 Wafer Bonding for High-Performance Logic Applications -- 6 Application of Bonded Wafers to the Fabrication of
Electronic Devices -- 7 Compound Semiconductor Heterostructures by Smart CutTM: SiC On Insulator, QUASICTM Substrates, InP and GaAs Heterostructures on Silicon -- 8 Three-Dimensional Photonic Bandgap Crystals by Wafer Bonding Approach
-- 9 Wafer Direct Bonding for High-Brightness Light-Emitting Diodes and Vertical-Cavity Surface-Emitting Lasers -- 10 High-Density Hybrid Integration of III–V Compound Optoelectronics with Silicon Integrated Circuits -- 11 Layer
Transfer by Bonding and Laser Lift-Off -- 12 Single-Crystal Lithium Niobate Films by Crystal Ion Slicing -- 13 Wafer Bonding of Ferroelectric Materials -- 14 Debonding of Wafer-Bonded Interfaces for Handling and Transfer Applications
ISBN:9783662108277
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in MATERIALS SCIENCE: 75
Keywords: Physics , Condensed matter , Electrical engineering , Optical materials , Electronic materials , Materials science , Materials , Thin films , Physics , Condensed Matter Physics , Characterization and Evaluation of Materials , Optical and Electronic Materials , Surfaces and Interfaces, Thin Films , Electrical Engineering
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Call number:SPRINGER-2004-9783662105498:ONLINE Show nearby items on shelf
Title:Thin-Film Solar Cells Next Generation Photovoltaics and Its Applications
Author(s):
Date:2004
Size:1 online resource (244 p.)
Note:10.1007/978-3-662-10549-8
Contents:1 Background and Motivation for Thin-Film Solar-Cell Development -- 2 Recent Advances and Future Opportunities for Thin-Film Solar Cell -- 3 Electrical and Optical Properties of Amorphous Silicon and Its Alloys -- 4 Preparation and
Properties of Nanocrystalline Silicon -- 5 Key Issues for the Efficiency Improvement of Silicon-Based Stacked Solar Cells -- 6 Development of Amorphous-Silicon Single-Junction Solar Cells and Their Application Systems -- 7 The
Production of a-Si:H/a-SiGe:H/a-SiGe:H Stacked Solar-Cell Modules and Their Applications -- 8 Low-Temperature Fabrication of Nanocrystalline-Silicon Solar Cells -- 9 Mass Production of Large-Area Integrated Thin-Film Silicon Solar-Cell
Module -- 10 Properties of Chalcopyrite-Based Materials and Film Deposition for Thin-Film Solar Cells -- 11 Development of Cu(InGa)Se2 Thin-Film Solar Cells -- 12 Expanding Thin-Film Solar PV System Applications -- 13 Future Prospects
for Photovoltaic Technologies in Japan
ISBN:9783662105498
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Photonics: 13
Keywords: Materials science , Optics , Optoelectronics , Plasmons (Physics) , Engineering , Optical materials , Electronic materials , Materials Science , Optical and Electronic Materials , Optics, Optoelectronics, Plasmonics and Optical Devices , Characterization and Evaluation of Materials , Engineering, general
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Call number:SPRINGER-2004-9783662100240:ONLINE Show nearby items on shelf
Title:Statistical Physics of Polymers An Introduction
Author(s): Toshihiro Kawakatsu
Date:2004
Size:1 online resource (216 p.)
Note:10.1007/978-3-662-10024-0
Contents:1 Introduction -- 2 Gaussian Chain Model and Statistics of Polymers -- 3 Mesoscopic Structures and Self-Consistent Field Theory -- 4 Ginzburg—Landau Theory -- 5 Macroscopic Viscoelastic Theory of Polymers -- References
ISBN:9783662100240
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Physical chemistry , Polymers , Atomic structure , Molecular structure , Spectra , Condensed matter , Statistical physics , Dynamical systems , Materials science , Physics , Atomic/Molecular Structure and Spectra , Statistical Physics, Dynamical Systems and Complexity , Physical Chemistry , Polymer Sciences , Characterization and Evaluation of Materials , Condensed Matter Physics
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Call number:SPRINGER-2004-9783662099407:ONLINE Show nearby items on shelf
Title:Solid State Theory An Introduction
Author(s): Ulrich Rössler
Date:2004
Size:1 online resource (346 p.)
Note:10.1007/978-3-662-09940-7
Contents:1. Introduction -- 2. The Solid as a Many-Particle Problem -- 3. Lattice Dynamics: Phonons -- 4. The Free Electron Gas -- 5. Electrons in a Periodic Potential -- 6. Spin Waves: Magnons -- 7. Correlated Electrons -- 8. Electron—Phonon
Interaction -- 9. Defects, Disorder, and Localization -- 10. Appendices -- References -- Solutions
ISBN:9783662099407
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Materials science , Engineering , Optical materials , Electronic materials , Materials , Thin films , Materials Science , Surfaces and Interfaces, Thin Films , Optical and Electronic Materials , Characterization and Evaluation of Materials , Engineering, general
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Call number:SPRINGER-2004-9783662092989:ONLINE Show nearby items on shelf
Title:Physics of Transition Metal Oxides
Author(s): Sadamichi Maekawa
Date:2004
Size:1 online resource (340 p.)
Note:10.1007/978-3-662-09298-9
Contents:1. Introduction -- 2. Cuprates -- 3. Theory of Superconductivity -- 4. Manganites -- 5. Titanates and Vanadates -- 6. Cobaltates -- 7. Quantum Effects in Orbitally Degenerate Systems -- Appendices -- D.1 Seebeck Effect -- D.2 Peltier
Effect -- D.3 Thomson Effect -- D.4 The First and Second Laws of Thermodynamics and Thermoelectric Response in Solids: Thomson’s Considerations -- D.5 The Third Law of Thermodynamics and Thermoelectric Response in Solids -- References
for Appendices
ISBN:9783662092989
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Solid-State Sciences: 144
Keywords: Materials science , Physical chemistry , Superconductivity , Superconductors , Magnetism , Magnetic materials , Optical materials , Electronic materials , Metals , Materials Science , Optical and Electronic Materials , Physical Chemistry , Metallic Materials , Characterization and Evaluation of Materials , Strongly Correlated Systems, Superconductivity , Magnetism, Magnetic Materials
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Call number:SPRINGER-2004-9783662092767:ONLINE Show nearby items on shelf
Title:Phase Diagrams and Heterogeneous Equilibria A Practical Introduction
Author(s): Bruno Predel
Date:2004
Size:1 online resource (352 p.)
Note:10.1007/978-3-662-09276-7
Contents:1 Fundamental Facts and Concepts -- 2 Phase Equilibria in One-Component Systems -- 3 Phase Equilibria in Two-Component Systems Under Exclusion of the Gas Phase -- 4 Phase Equilibria in Three-Component Systems and Four-Component
Systems with Exclusion of the Gas Phase -- 5 Phase Equilibria Including a Vapor Phase -- 6 Thermodynamics -- 7 Nucleation During Phase Transitions -- 8 Metastable Phases -- 9 Effect of Diffusion on Phase Transformations -- 10 Organic
and Polymeric Materials
ISBN:9783662092767
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Physical chemistry , Condensed matter , Thermodynamics , Heat engineering , Heat transfer , Mass transfer , Materials science , Physics , Condensed Matter Physics , Characterization and Evaluation of Materials , Physical Chemistry , Engineering Thermodynamics, Heat and Mass Transfer
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Call number:SPRINGER-2004-9783662091562:ONLINE Show nearby items on shelf
Title:Orientations and Rotations Computations in Crystallographic Textures
Author(s): Adam Morawiec
Date:2004
Size:1 online resource (200 p.)
Note:10.1007/978-3-662-09156-2
Contents:1 Preliminaries -- 2 Parameterizations -- 3 Geometry of the Rotation Space -- 4 More on Small Orientation Changes -- 5 Some Statistical Issues -- 6 Symmetry -- 7 Misorientation Angle and Axis Distributions -- 8 Crystalline Interfaces
and Symmetry -- 9 Crystallographic Textures -- 10 Diffraction Geometry -- 11 Effective Elastic Properties of Polycrystals -- References
ISBN:9783662091562
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Chemistry, Physical and theoretical , Mineralogy , Geometry , Crystallography , Materials science , Physics , Crystallography , Theoretical and Computational Chemistry , Characterization and Evaluation of Materials , Mineralogy , Geometry
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Call number:SPRINGER-2004-9783662091159:ONLINE Show nearby items on shelf
Title:Optics of Semiconductors and Their Nanostructures
Author(s):
Date:2004
Size:1 online resource (348 p.)
Note:10.1007/978-3-662-09115-9
Contents:Excitons in Semiconductors -- Hot Excitons in ZnSe Quantum Wells -- Probing Localized Excitons by Speckle Analysis of Resonant Light Scattering -- Donor-Related Exciton Luminescence in Wide-Bandgap Semiconductors: Diamond, Zinc Oxide,
and Gallium Nitride -- Spectroscopy of Biexcitons and Trions in II–VI Quantum Dots -- Dynamics of Excitons and Exciton Complexes in Wide-Gap Semiconductors -- Quantum Kinetics and Femtosecond Spectroscopy — The Discovery of Slowness --
Extreme Nonlinear Optics in Semiconductors -- Nonlinear Semiconductor Microcavities -- All-Optical Control of Charge and Spin in GaAs: Densities and Currents -- Semiconductor Quantum Dots for Optoelectronic Applications -- GaInNAs:
Fundamentals of a New Material System for Near-Infrared Optoelectronics -- Nitride-Based Light Emitting Diodes and Laser Diodes: Optical Properties and Applications -- Thermodynamics of Solar Cells
ISBN:9783662091159
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Solid-State Sciences: 146
Keywords: Physics , Quantum optics , Condensed matter , Optics , Optoelectronics , Plasmons (Physics) , Engineering , Materials science , Physics , Quantum Optics , Characterization and Evaluation of Materials , Condensed Matter Physics , Optics, Optoelectronics, Plasmonics and Optical Devices , Engineering, general
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Call number:SPRINGER-2004-9783662089880:ONLINE Show nearby items on shelf
Title:Nondestructive Materials Characterization With Applications to Aerospace Materials
Author(s):
Date:2004
Size:1 online resource (418 p.)
Note:10.1007/978-3-662-08988-0
Contents:1 Degradation of Aircraft Structures -- 2 Optical Detection of Surface Damage -- 3 Microradiographic and Foil Penetration Methods for Quantification of Localized Corrosion -- 4 Interferometric and Holographic Imaging of Surface Wave
Patterns for Characterization of Material Degradation -- 5 Surface Acoustic Wave Characterization of Pitting Corrosion Damage with Fatigue Crack -- 6 Ultrasonic Fatigue Crack Detection in Aluminum and Titanium Alloys -- 7 Early
Detection of Fatigue Damage in Ti-6A1-4V with Nonlinear Acoustics -- 8 Ultrasonic Absorption Measurements -- 9 Thermographic Materials Characterization -- 10 Scanning Vibrating Electrode Technique as a Benchmark for NDE of Corrosion --
11 Acoustic Imaging Techniques for Characterization of Corrosion, Corrosion Protective Coatings, and Surface Cracks -- 12 Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy -- 13 High Resolution
Microellipsometry -- 14 Positron Annihilation Spectroscopy (PAS)
ISBN:9783662089880
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Materials Science: 67
Keywords: Physics , Condensed matter , Engineering , Materials science , Materials , Thin films , Physics , Condensed Matter Physics , Surfaces and Interfaces, Thin Films , Characterization and Evaluation of Materials , Engineering, general
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Call number:SPRINGER-2004-9783662088142:ONLINE Show nearby items on shelf
Title:Modulation Calorimetry Theory and Applications
Author(s): Yaakov Kraftmakher
Date:2004
Size:1 online resource (288 p.)
Note:10.1007/978-3-662-08814-2
Contents:1 Introduction -- 2 Theory of Modulation Calorimetry -- 3 Modulation of Heating Power -- 4 Measurement of Temperature Oscillations -- 5 Brief Review of Methods of Calorimetry -- 6 Modulation Calorimetry I -- 7 Modulation Calorimetry
II -- 8 Modulation Dilatometry -- 9 Other Modulation Techniques -- 10 Noise Thermometry of Wire Samples -- 11 Electronics for Modulation Measurements -- 12 Accuracy of Modulation Measurements -- 13 Studies at High Temperatures -- 14
Phase Transitions -- 15 Relaxation Phenomena -- 16 Five Student Experiments -- Conclusion -- References
ISBN:9783662088142
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Continuum physics , Thermodynamics , Condensed matter , Physical measurements , Measurement , Engineering , Materials science , Physics , Thermodynamics , Measurement Science and Instrumentation , Classical Continuum Physics , Condensed Matter Physics , Engineering, general , Characterization and Evaluation of Materials
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Call number:SPRINGER-2004-9783662070642:ONLINE Show nearby items on shelf
Title:Epitaxy Physical Principles and Technical Implementation
Author(s): Marian A Herman
Date:2004
Size:1 online resource (525 p.)
Note:10.1007/978-3-662-07064-2
Contents:I. Basic Concepts -- 1. Introduction -- 2. Homo- and Heteroepitaxial Crystallization Phenomena -- 3. Application Areas of Epitaxially Grown Layer Structures -- II. Technical Implementation -- 4. Solid Phase Epitaxy -- 5. Liquid Phase
Epitaxy -- 6. Vapor Phase Epitaxy -- 7. Molecular Beam Epitaxy -- 8. Metal Organic Vapor Phase Epitaxy -- III. In-situ Analysis of the Growth Processes -- 9. In-situ Analysis of Species and Transport -- 10. In-situ Surface Analysis --
IV. Physics of Epitaxy -- 11. Thermodynamic Aspects -- 12. Atomistic Aspects -- 13. Quantum Mechanical Aspects -- V. Heteroepitaxy -- 14. Heteroepitaxy Growth Phenomena -- 15. Material-Related Problems of Heteroepitaxy -- 16. Closing
Remarks -- References -- List of Abbreviations -- List of Metalorganic Precursors
ISBN:9783662070642
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in MATERIALS SCIENCE: 62
Keywords: Physics , Physical chemistry , Chemical engineering , Crystallography , Optical materials , Electronic materials , Materials science , Physics , Crystallography , Optical and Electronic Materials , Characterization and Evaluation of Materials , Industrial Chemistry/Chemical Engineering , Physical Chemistry
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Call number:SPRINGER-2004-9783662067239:ONLINE Show nearby items on shelf
Title:Diffraction Analysis of the Microstructure of Materials
Author(s):
Date:2004
Size:1 online resource (554 p.)
Note:10.1007/978-3-662-06723-9
Contents:1 Line Profile Analysis: A Historical Overview -- 2 Convolution Based Profile Fitting -- 3 Whole Powder Pattern Modelling: Theory and Applications -- 4 Full Profile Analysis of X-ray Diffraction Patterns for Investigation of
Nanocrystalline Systems -- 5 Crystallite Size and Residual Strain/Stress Modeling in Rietveld Refinement -- 6 The Quantitative Determination of the Crystalline and the Amorphous Content by the Rietveld Method: Application to Glass
Ceramics with Different Absorption Coefficients -- 7 Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials -- 8 A Bayesian/Maximum Entropy Method for the Certification of a
Nanocrystallite-Size NIST Standard Reference Material -- 9 Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave -- 10 Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis -- 11 X-ray
Peak Broadening Due to Inhomogeneous Dislocation Distributions -- 12 Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials -- 13 Line Profile Fitting: The Case of fcc Crystals Containing Stacking Faults --
14 Diffraction Elastic Constants and Stress Factors Grain Interaction and Stress in Macroscopically Elastically Anisotropic Solids The Case of Thin Films -- 15 Interaction between Phases in Co-deforming Two-Phase Materials: The Role of
Dislocation Arrangements -- 16 Grain Surface Relaxation Effects in Powder Diffraction -- 17 Interface Stress in Polycrystalline Materials -- 18 Problems Related to X-Ray Stress Analysis in Thin Films in the Presence of Gradients and
Texture -- 19 Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers -- 20 Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond
ISBN:9783662067239
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Materials Science: 68
Keywords: Physics , Condensed matter , Crystallography , Engineering , Nanotechnology , Materials science , Materials , Thin films , Physics , Condensed Matter Physics , Nanotechnology , Characterization and Evaluation of Materials , Surfaces and Interfaces, Thin Films , Crystallography , Engineering, general
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Call number:SPRINGER-2004-9783662061084:ONLINE Show nearby items on shelf
Title:Biomedical Devices and Their Applications
Author(s):
Date:2004
Size:1 online resource (201 p.)
Note:10.1007/978-3-662-06108-4
Contents:1 Biomaterials in Drug Delivery -- 2 Drug Delivery Systems for Localized Treatment of Disease -- 3 Application of Protein Electrophoresis Techniques -- 4 Xenoestrogens as Endocrine Disrupters -- 5 Medical Devices
ISBN:9783662061084
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Pharmacology , Biotechnology , Endocrinology , Orthopedics , Biophysics , Biological physics , Materials science , Physics , Biophysics and Biological Physics , Characterization and Evaluation of Materials , Orthopedics , Biotechnology , Pharmacology/Toxicology , Endocrinology
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Call number:SPRINGER-2004-9783662061046:ONLINE Show nearby items on shelf
Title:Biomaterials and Tissue Engineering
Author(s):
Date:2004
Size:1 online resource (246 p.)
Note:10.1007/978-3-662-06104-6
Contents:1 Bioactive Materials and Processing -- 2 Biocompatibility of Materials -- 3 Biotechnological Applications of Inorganic Glasses -- 4 Biocomposite Materials for Biotechnology -- 5 Tissue Engineering
ISBN:9783662061046
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Pharmacology , Biotechnology , Inorganic chemistry , Orthopedics , Biophysics , Biological physics , Materials science , Physics , Biophysics and Biological Physics , Characterization and Evaluation of Materials , Inorganic Chemistry , Orthopedics , Biotechnology , Pharmacology/Toxicology
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Call number:SPRINGER-2004-9783642189432:ONLINE Show nearby items on shelf
Title:Unified Strength Theory and Its Applications
Author(s): Mao-Hong Yu
Date:2004
Size:1 online resource (412 p.)
Note:10.1007/978-3-642-18943-2
Contents:Stress States of Elements -- Unified Yield Criteria -- Verification of the Yield Criterion -- Extended Unified Yield Criterion -- Basic Characteristics of Strength of Materials under Complex Stress -- Unified Strength Theory --
Experimental Verification of Strength Theory -- Applications of the Unified Yield Criterion -- The Effects of Failure Criteria on Structural Analysis -- Historical Reviews -- References and Bibliography -- Author Index
ISBN:9783642189432
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Mechanics , Mechanics, Applied , Materials science , Physics , Mechanics , Materials Science, general , Theoretical and Applied Mechanics , Characterization and Evaluation of Materials
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Call number:SPRINGER-2004-9783642188701:ONLINE Show nearby items on shelf
Title:Silicon Carbide Recent Major Advances
Author(s):
Date:2004
Size:1 online resource (899 p.)
Note:10.1007/978-3-642-18870-1
Contents:Zero- and Two-Dimensional Native Defects -- Defect Migration and Annealing Mechanisms -- Hydrogen in SiC -- Electronic Properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes -- Principles and Limitations of Numerical
Simulation of SiC Boule Growth by Sublimation -- Defect Formation and Reduction During Bulk SiC Growth -- High Nitrogen Doping During Bulk Growth of SiC -- Homoepitaxial and Heteroepitaxial Growth on Step-Free SiC Mesas -- Low-Defect
3C-SiC Grown on Undulant-Si (001) Substrates -- New Development in Hot Wall Vapor Phase Epitaxial Growth of Silicon Carbide -- Formation of SiC Thin Films by Ion Beam Synthesis -- Atomic Structure of SiC Surfaces -- The Continuum of
Interface-Induced Gap States — The Unifying Concept of the Band Lineup at Semiconductor Interfaces — Application to Silicon Carbide -- Contributions to the Density of Interface States in SiC MOS Structures -- Properties of Nitrided
Oxides on SiC -- Hall Effect Studies of Electron Mobility and Trapping at the SiC/SiO2 Interface -- Optical Properties of SiC: 1997–2002 -- Cyclotron Resonance Studies of Effective Masses and Band Structure in SiC -- Electronic
Structure of Deep Defects in SiC -- Phosphorus-Related Centers in SiC -- Hall Scattering Factor for Electrons and Holes in SiC -- Radiotracer Deep Level Transient Spectroscopy -- Vacancy Defects Detected by Positron Annihilatio --
Characterization of Defects in SiC Crystals by Raman Scattering -- Characterization of Low-Dimensional Structures in SiC Using Advanced Transmission Electron Microscopy -- Synchrotron White Beam X-Ray Topography and High Resolution
X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Device Structures -- Ohmic Contacts for Power Devices on SiC -- Micromachining of SiC -- Surface Preparation Techniques for SiC Wafers -- Epitaxial Growth and Device
Processing of SiC on Non-Basal Planes -- SiC Power Bipolar Transistors and Thyristors -- High Voltage SiC Devices -- Power MOSFETs in 4H-SiC: Device Design and Technology -- Normally-Off Accumulation-Mode Epi-Channel Field Effect
Transistor -- Development of SiC Devices for Microwave and RF Power Amplifiers -- Advances in SiC Field Effect Gas Sensors
ISBN:9783642188701
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Engineering , Condensed matter , Optics , Optoelectronics , Plasmons (Physics) , Electronics , Microelectronics , Optical materials , Electronic materials , Materials science , Materials , Thin films , Engineering , Electronics and Microelectronics, Instrumentation , Optical and Electronic Materials , Characterization and Evaluation of Materials , Surfaces and Interfaces, Thin Films , Condensed Matter Physics , Optics, Optoelectronics, Plasmonics and Optical Devices
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Call number:SPRINGER-2004-9783642187520:ONLINE Show nearby items on shelf
Title:Multiphased Ceramic Materials Processing and Potential
Author(s):
Date:2004
Size:1 online resource (152 p.)
Note:10.1007/978-3-642-18752-0
Contents:1 Multi-phase Materials -- 1.1 Introduction -- 1.2 The Basic Concept of Multi-phase Materials -- 1.3 The Need for Multi-phase Materials -- 1.4 Research Objectives -- References -- 2 New Concepts in the Design of Tough Ceramics -- 2.1
Introduction -- 2.2 Experiments -- 2.3 Results and Discussion -- 2.4 Conclusions -- Acknowledgement -- References -- 3 Interface Design of Tough Ceramics: Si3N4/BN Fibrous Monolithic Ceramic -- 3.1 Introduction -- 3.2 Measurement of
Interfacial Toughness -- 3.3 Preparation of Si3N4/BN Fibrous Monolithic Ceramic -- 3.4 Conclusions -- Acknowledgement -- References -- 4 Microstructural Design : Si/SiC Composites Derived from Wood -- 4.1 Introduction -- 4.2
Experimental Work -- 4.3 Results and Discussion -- Acknowledgements -- References -- 5 Microstructure through Design in-situ Seeding Technique -- 5.1 Introduction -- 5.2 Experimental Work -- 5.3 Results and Discussion -- 5.4 Summary
and Conclusions -- Acknowledgements -- References -- 6 Directional Solidification : ZrB2-LaB6 Eutectic Composites -- 6.1 Introduction -- 6.2 Experimental Work -- 6.3 Results and Discussion -- 6.4 Conclusions -- Acknowledgements --
References -- 7 A Co-Sedimentation Technique to Fabricate Continuous Gradient Composites -- 7.1 Introduction -- 7.2 Physical Modeling -- 7.3 Numerical Modeling -- 7.4 Results and Discussions -- 7.5 Validation of the Model -- 7.6
Conclusions -- Acknowledgements -- References -- 8 Spark Plasma Sintering : A Promising New Technique and its Mechanism -- 8.1 Introduction -- 8.2 Experimental Work -- 8.3 Results -- 8.4 Discussion -- 8.5 Conclusions -- Acknowledgments
-- References -- 9 Pulsed Chemical Vapor Infiltration : Carbon/SiC Nanocomposites -- 9.1 Introduction -- 9.2 Experimental Work -- 9.3 Results and Discussion -- 9.4 Summary -- Acknowledgements -- References -- 10 Metal Oxidation Process
: NiAl/Al2O3 Composites -- 10.1 Introduction -- 10.2 Experimental Work -- 10.3 Results and Discussion -- 10.4 Conclusions -- Acknowledgment -- References -- 11 Co-electroplating Nano-ceramic Particulates with Ni Layer -- 11.1
Introduction -- 11.2 Experimental Procedures -- 11.3 Results and Discussion -- 11.4 Conclusions -- References -- 12 Hot-Pressing Technique : SiC/AlN Composites -- 12.1 Introduction -- 12.2 Applications of Silicon Carbide Ceramics --
12.3 SiC/AlN Particulate Composites -- 12.4 Conclusions -- Acknowledgements -- References -- 13 Nondestructive Evaluation of Strength and Residual Stress using Sphere Indentation -- 13.1 Introduction -- 13.2 Effect of Stress Gradient
on Fracture -- 13.3 Critical Issues and Local Strength -- 13.4 Experimental Work -- 13.5 Proof Tests of Strength -- 13.6 Discussions and Conclusions -- Acknowledgements -- References -- 14 Machinable Ceramic Graded Composites -- 14.1
Introduction -- 14.2 Basic Design Principles -- 14.3 Machinable Graded Si3N4/h-BN Composite -- 14.4 Machinable Graded Al2O3/LaPO4 Composite -- 14.5 Conclusions -- References -- 15 Future of Structural Multi-phase Ceramics -- 15.1
Obstacles for the Applications of Ceramics -- 15.2 Novel Materials -- 15.3 Challenges -- References
ISBN:9783642187520
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Materials Science: 66
Keywords: Physics , Condensed matter , Engineering , Optical materials , Electronic materials , Materials science , Physics , Condensed Matter Physics , Optical and Electronic Materials , Characterization and Evaluation of Materials , Engineering, general
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Call number:SPRINGER-2004-9783642185038:ONLINE Show nearby items on shelf
Title:Applications of the Isotopic Effect in Solids
Author(s): Vladimir G Plekhanov
Date:2004
Size:1 online resource (334 p.)
Note:10.1007/978-3-642-18503-8
Contents:1 Introduction -- 2 Phonon Spectra of Solids: Indicator of Their Isotope Purity -- 2.1 Theory of Lattice Dynamics -- 2.2 Elastic Properties -- 2.3 Vibrational Properties -- 3 Thermal Properties -- 3.1 Dependence of the Thermal
Conductivity on the Isotopic Composition -- 3.2 Lattice Constant Dependence on Temperature and Isotopic Composition -- 4 Isotopic Renormalization of the Electronic Excitation Energy Spectrum -- 4.1 Exciton States -- 4.2 Exciton-Phonon
Interaction -- 4.3 Giant Isotopic Effect in the Energy Spectrum of Wannier-Mott Exciton in LiH Crystals -- 4.4 Nonlinear Dependence of Band-Gap Energy on the Isotopic Effect -- 4.5 Renormalization of Binding Energy of Wannier-Mott
Excitons by Isotopic Effect -- 4.6 Nonlinear Dependence of Binding Energy on Isotopic Concentration -- 4.7 Isotopic Effect in the Luminescence Spectrum -- 5 Process of Self-Diffusion in Isotopically Pure Materials and Heterostructures
-- 5.1 General Remarks -- 5.2 The Relation of Diffusion Experiments to the Mathematics of Diffusion -- 5.3 The Self-Diffusion Process -- 5.4 The SIMS-Technique -- 5.5 Self-Diffusion of Li and H in LiH Crystals -- 5.6 Self-Diffusion in
Intrinsic Ge -- 5.7 Self- and Interdiffusion of Ga and Al in Isotopically Pure and Doped Heterostructures -- 6 Neutron Transmutative Doping -- 6.1 The NTD Process: A New Reactor Technology -- 6.2 Reactor Facilities for Transmutative
Doping -- 6.3 Nuclear Reaction Under the Influence of Charged Particles -- 6.4 Nuclear Reaction Under the Action of the ?-Rays -- 6.5 Nuclear Reactions Under the Influence of Neutrons -- 6.6 The Influence of Dopants -- 6.7 Atomic
Displacement Effects in NTD -- 6.8 Experimental Results -- 7 Optical Fiber -- 7.1 Optical Communication -- 7.2 Maxwell’s Equations -- 7.3 Geometric Optics of Fibers -- 7.4 Waveguide Mode Propagation -- 7.5 Pulse Spreading -- 7.6
Materials for Optical Fibers -- 7.7 Fiber Preparation -- 7.8 Isotopes in Fibers -- 8 Laser Materials -- 8.1 Some General Remarks -- 8.2 Absorption and Induced Emission -- 8.3 Semiconductor Lasers -- 8.4 Nonlinear Properties of Excitons
in Isotopically Mixed Crystals -- 9 Other Unexplored Applications of Isotopic Engineering -- 9.1 Isotopic Information Storage -- 9.2 Isotopic Structuring for Fundamental Studies -- 9.3 Other Possibilities -- 10 Conclusion -- References
ISBN:9783642185038
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Materials Science: 70
Keywords: Physics , Mechanics , Nuclear physics , Atoms , Condensed matter , Optical materials , Electronic materials , Materials science , Physics , Mechanics , Condensed Matter Physics , Atomic, Molecular, Optical and Plasma Physics , Particle and Nuclear Physics , Optical and Electronic Materials , Characterization and Evaluation of Materials
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Call number:SPRINGER-2004-9783540450931:ONLINE Show nearby items on shelf
Title:UV-Visible Reflection Spectroscopy of Liquids
Author(s): Jukka Räty
Date:2004
Size:1 online resource (5 p.)
Note:10.1007/978-3-540-45093-1
Contents:I Theory of Reflectometry -- 1 Demands on Measurement of Optical Constants of Liquids in Science and Industry -- 2 Liquids -- 3 Theory of Optical Constants -- 4 Theory of Reflectance -- 5 Probe Window Contamination and Reflectance --
6 Wavelength Spectra Analysis -- II Practical Reflectometry -- 7 Introduction -- 8 Definitions of Optical Instrumentation and Measurement -- 9 Exploring the Insides of a Spectrophotometer -- 10 Understanding Your Signal -- 11 Before
Measurement -- 12 From Theory to Measurement -- Appendices -- A Intensity Law for Nonlinear Absorption -- B Complex Angle of Refraction -- C Cauchy-Riemann Equations -- D Kramers-Kronig Integrals and Symmetry Properties -- References
ISBN:9783540450931
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Optical Sciences: 92
Keywords: Chemistry , Mass spectrometry , Optics , Electrodynamics , Solid state physics , Optoelectronics , Plasmons (Physics) , Spectroscopy , Microscopy , Materials science , Chemistry , Mass Spectrometry , Optics and Electrodynamics , Solid State Physics , Spectroscopy and Microscopy , Optics, Optoelectronics, Plasmonics and Optical Devices , Characterization and Evaluation of Materials
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Call number:SPRINGER-2004-9783540400325:ONLINE Show nearby items on shelf
Title:Photonic Crystals Physics, Fabrication and Applications
Author(s):
Date:2004
Size:1 online resource (324 p.)
Note:10.1007/978-3-540-40032-5
Contents:Introduction -- Survey of Fundamental Features of Photonic Crystals -- Theory I: Basic Aspects of Photonic Bands -- Theory II: Advanced Topics of Photonic Crystals -- Two-Dimensional Photonic Crystals -- Two-Dimensional Photonic
Crystal Slabs -- Three-Dimensional Photonic Crystals -- Other Types of Photonic Crystals -- Spectroscopic Methods for Characterization -- Interaction between Light and Matter in Photonic Crystals -- Photonic Crystal Devices --
Application to Ultrafast Optical Planar Integrated Circuit -- Photonic Crystals in the Terahertz Region -- Perspective -- Appendix A: Reciprocal Lattic Vector and Discrete Wavevector -- Appendix B: Phase Shift of Light and Density of
State
ISBN:9783540400325
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in OPTICAL SCIENCES: 94
Keywords: Materials science , Condensed matter , Lasers , Photonics , Optics , Optoelectronics , Plasmons (Physics) , Engineering , Optical materials , Electronic materials , Materials Science , Optical and Electronic Materials , Optics, Optoelectronics, Plasmonics and Optical Devices , Characterization and Evaluation of Materials , Condensed Matter Physics , Laser Technology, Photonics , Engineering, general
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Call number:SPRINGER-2004-9783540399155:ONLINE Show nearby items on shelf
Title:Computational Materials Science From Basic Principles to Material Properties
Author(s):
Date:2004
Size:1 online resource (320 p.)
Note:10.1007/b11279
Contents:Introduction -- Density Functional Theory and the Full-Potential Local-Orbital Approach -- Methods for Band Structure Calculations in Solids -- A Solid-State Theoretical Approach to the Optical Properties of Photonic Crystals --
Simulation of Active and Nonlinear Photonic Nanomaterials in the Finite-Difference Time-Domain Framework -- Symmetry Properties of Electronic and Photonic Band Structures -- From the Cluster to the Liquid: Ab initio Calculations on
Realistic Systems Based on First-Principles Molecular Dynamics -- Magnetism, Structure and Interactions at the Atomic Scale -- Present-Day Achievements of Molecular Dynamics Simulations -- Computational Materials Science with
'Materials Studio': Applications in Catalysis -- Integration of Modelling at Various Length and Time Scales -- Simulation of Material Behaviour from the Engineering Viewpoint - Classical Approaches and New Trends -- Parallel
Implementation Strategies for Algorithms from Scientific Computing -- Multi-Grid Methods - An Introduction
ISBN:9783540399155
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Lecture Notes in Physics: 642
Keywords: Physics , Condensed matter , Engineering , Materials science , Physics , Condensed Matter Physics , Characterization and Evaluation of Materials , Theoretical, Mathematical and Computational Physics , Engineering, general
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Call number:SPRINGER-2004-9781475739015:ONLINE Show nearby items on shelf
Title:Chemical Vapor Deposition Polymerization The Growth and Properties of Parylene Thin Films
Author(s): Jeffrey B Fortin
Date:2004
Size:1 online resource (102 p.)
Note:10.1007/978-1-4757-3901-5
Contents:1. Introduction -- 2. Deposition Equipment -- 3. Step-by-Step Guide to Depositing Parylene -- 4. Parylene-N Precursor Chemistry -- 5. Deposition Kinetics for Polymerization via the Gorham Route -- 6. Film Properties -- 7. Other CVD
Polymers -- References
ISBN:9781475739015
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Chemical engineering , Surfaces (Physics) , Interfaces (Physical sciences) , Thin films , Materials science , Physics , Surface and Interface Science, Thin Films , Industrial Chemistry/Chemical Engineering , Characterization and Evaluation of Materials
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Call number:SPRINGER-2004-9781447138273:ONLINE Show nearby items on shelf
Title:Model Order Reduction Techniques with Applications in Finite Element Analysis
Author(s): Zu-Qing Qu
Date:2004
Size:1 online resource (369 p.)
Note:10.1007/978-1-4471-3827-3
Contents:1 Introduction to Dynamic Model Reduction Techniques -- 2 Finite Element Modeling -- 3 Theory of Modal Analysis -- 4 Static Condensation -- 5 Dynamic Condensation -- 6 Iterative Methods for Dynamic Condensation -- 7 Selection of
Master Degrees of Freedom -- 8 Dynamic Condensation of Nonclassically Damped Models -- 9 Application I: Model Reduction on System Level -- 10 Application II: Model Reduction on Component Level—Superelement Modeling Technique -- 11
Applications III: Modal Testing -- 12 Summary of Other Model Order Reduction Techniques
ISBN:9781447138273
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Mathematics , Computer simulation , Applied mathematics , Engineering mathematics , Computational intelligence , Structural mechanics , Vibration , Dynamical systems , Dynamics , Materials science , Mathematics , Applications of Mathematics , Computational Intelligence , Characterization and Evaluation of Materials , Simulation and Modeling , Structural Mechanics , Vibration, Dynamical Systems, Control
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Call number:SPRINGER-2004-9781441990259:ONLINE Show nearby items on shelf
Title:Methods and Materials for Remote Sensing Infrared Photo-Detectors, Radiometers and Arrays
Author(s): Yuri Abrahamian
Date:2004
Size:1 online resource (160 p.)
Note:10.1007/978-1-4419-9025-9
Contents:1. Photoelectric and Noise Characteristics of Photodetectors -- 2. Physical Principles of Infrared Radiometric Systems -- 3. Growing Technology and Electro-Physical Characteristics of Solid Solutions PbSnTe, PbSnSe and CdHdTe --
References
ISBN:9781441990259
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Remote sensing , Optics , Optoelectronics , Plasmons (Physics) , Electrical engineering , Materials science , Physics , Optics, Optoelectronics, Plasmonics and Optical Devices , Remote Sensing/Photogrammetry , Characterization and Evaluation of Materials , Electrical Engineering
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Call number:SPRINGER-2004-9781402081033:ONLINE Show nearby items on shelf
Title:Stochastic Geometry: Selected Topics
Author(s): Viktor Beneš
Date:2004
Size:1 online resource (221 p.)
Note:10.1007/b129604
Contents:Preliminaries -- Random Measures and Point Processes -- Random Fibre and Surface Systems -- Vertical Sampling Schemes -- Fibre and Surface Anisotropy -- Particle Systems
ISBN:9781402081033
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Mathematics , Measure theory , Convex geometry , Discrete geometry , Probabilities , Statistics , Materials science , Mathematics , Probability Theory and Stochastic Processes , Statistics, general , Convex and Discrete Geometry , Measure and Integration , Characterization and Evaluation of Materials
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Call number:SPRINGER-2004-9781402079252:ONLINE Show nearby items on shelf
Title:Dynamical Theory of Dendritic Growth in Convective Flow
Author(s): Jian-Jun Xu
Date:2004
Size:1 online resource (256 p.)
Note:10.1007/b130342
Contents:Interfacial Wave Theory of Dendritic Growth from Pure Melt with no Convection -- Steady Dendritic Growth from Melt with Convective Flow -- Steady Viscous Flow Past a Paraboloid of Revolution -- Asymptotic Solution of Dendritic Growth
in External Flow (I): The Case of Rapid Growth U?U? -- Asymptotic Solution of Dendritic Growth in External Flow (II): The Case of Pr ? ? -- Steady Dendritic Growth with Natural Convection (I): The Case of Pr= O(1) and ¯G ?1 -- Steady
Dendritic Growth with Natural Convection (II): The Case of Pr ?1 and ¯G= O(1) -- Stability and Selection of Dendritic Growth with Convective Flow -- Concluding Remark
ISBN:9781402079252
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Advances in Mechanics and Mathematics : 7
Keywords: Mathematics , Applied mathematics , Engineering mathematics , Mathematical models , Condensed matter , Materials science , Mathematics , Applications of Mathematics , Characterization and Evaluation of Materials , Mathematical Modeling and Industrial Mathematics , Condensed Matter Physics
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Call number:SPRINGER-2004-9781402024023:ONLINE Show nearby items on shelf
Title:Acoustical Imaging
Author(s):
Date:2004
Size:1 online resource (774 p.)
Note:10.1007/978-1-4020-2402-3
Contents:Components & Systems -- NDT -- Seismic Imaging -- Acoustic Microscopy -- Medical & Biological Imaging -- Near Field Imaging -- Author Index
ISBN:9781402024023
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Acoustical Imaging: 27
Keywords: Physics , Geophysics , Radiology , Acoustics , Vibration , Dynamical systems , Dynamics , Materials science , Physics , Acoustics , Vibration, Dynamical Systems, Control , Ultrasound , Characterization and Evaluation of Materials , Geophysics/Geodesy
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