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SPIRES-BOOKS: FIND KEYWORD ELECTRIC STANDARDS *END*INIT* use /tmp/qspiwww.webspi1/5567.69 QRY 131.225.70.96 . find keyword electric standards ( in books using www Cover Image
Call number:TK3307.A69::1997 Show nearby items on shelf
Title:Rating of electric cables : ampacity computations for transmission, distribution, and industrial applications
Author(s): George J. Anders
Date:1997
Publisher:Institute of Electrical and Electronics Engineers, New York
Size:428
ISBN:0780311779
Series:IEEE Press power engineering series 55B
Keywords: Electric cables Standards.
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Call number:TK275.N213::2007 Show nearby items on shelf
Title:McGraw-Hill's National Electrical Safety Code (NESC) 2007 Handbook
Author(s): David J. Marne (ed.)
Date:2007
Publisher:Institute of Electrical and Electronics Engineers
Note:Based on the Current 2007 National Electrical Safety Code (NESC), Designed to be used with NESC published by IEEE.
Note:See also: NFPA 70E, Part of the National Fire Code Series
ISBN:9780071453677
Keywords: Electric Engineering - Saftey Measures - Standards United States , Electric Power - Saftey Measures - Standards United States , Electric Engineering - Saftey Regulations - United States , Electric Engineering - Saftey Measures - Handbooks, Manuals ect.
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Call number:SPRINGER-1998-9783709175064:ONLINE Show nearby items on shelf
Title:Modern Developments and Applications in Microbeam Analysis
Author(s):
Date:1998
Size:1 online resource (392 p.)
Note:10.1007/978-3-7091-7506-4
Contents:Recent Developments in Instrumentation for X-Ray Microanalysis -- High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors -- Efficiency Calibration of a Si(Li) Detector by EPMA --
Wavelength-Dispersive X-Ray Spectrometry -- X-Ray Spectrum Processing and Multivariate Analysis -- Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope -- On the Spatial Resolution in Analytical Electron
Microscopy -- Contamination in Analytical Electron Microscopy and in ALCHEMI -- Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy -- Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials --
Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide Microbeam Investigations -- Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and
Microcrystals -- Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs -- SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation -- Surface Characterisation and Modification of YBCO Thin Films by STM --
Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA -- EPMA Sputter Depth Profiling, Part I: Theory and Evaluation -- EPMA Sputter Depth Profiling, Part II: Experiment -- Quantitative Analysis of BN (C, O, Ar,
H)-Coatings Using EPMA and SIMS -- Quantitative EDS Analysis of SiO2/Al2O3/TiO2 Multilayer Films -- Surface Ionization of Thin Films on Substrates: Measurement and Simulation -- Comparison of Different Methods to Characterize Thin
a-Si:H Films -- EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation -- Analysis of Thin Films with Slightly Rough Boundaries -- Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour
Deposition Method -- EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs -- EPMA of Melted UO2 Fuel Rods from the Phebus-FP Reactor Accident Experiment -- Steels, Carbon Concentration, and Microhardness -- Determination
of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods -- EPMA of the Composition of Opal-Based Nanostructured Materials -- NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas --
Compositional X-Ray Maps of Metamorphic and Magmatic Minerals -- Chemical Mapping of Weathering Stages in Laterites -- Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides
and Sulpharsenides: Problems, Solutions, and Applications -- Composition of 15–17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium -- Potassium Migration in Silica Glass During Electron Beam Irradiation -- X-Ray
Microanalysis of Frozen-Hydrated Biological Bulk Samples -- Environmental SEM and X-Ray Microanalysis of Biological Materials -- Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM -- The
Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam -- Standardless Analysis -- A New Technique for Standardless Analysis by EPMA-TWIX -- Stopping Power Factor for Standardless QEPMA -- On the
Measurement of the Backscattering Coefficient for Low Energy Electrons -- Monte Carlo Simulations of Edge Artefacts in MULSAM Images -- Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations -- A Rapid Comparison of
Matrix Corrections in AES and XPS by Means of Computer Programs -- Fractals and BaTiO3-Ceramic Microstructure Analysis -- Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies --
Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions -- The Standards, Measurements and Testing Programme (SMT), the European Support to
Standardisation, Measurements and Testing Projects
ISBN:9783709175064
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta Supplement: 15
Keywords: Materials science , Analytical chemistry , Materials Science , Characterization and Evaluation of Materials , Analytical Chemistry
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Call number:SPRINGER-1989-9783642884214:ONLINE Show nearby items on shelf
Title:The Hydrogen Atom Proceedings of the Symposium, Held in Pisa, Italy, June 30–July 2, 1988
Author(s):
Date:1989
Size:1 online resource (353 p.)
Note:10.1007/978-3-642-88421-4
Contents:I Precision Spectroscopy of Hydrogen: Fundamental Physics and Universal Constants -- The Hydrogen Atom (An Historical Account of Studies of Its Spectrum) -- Interference of the Hydrogen Atom States (n=2) -- Separated Oscillatory Field
Measurement of the Lamb Shift in H, n=2 -- Hydrogen Spectroscopy and Fundamental Physics -- Doppler-Free Two-Photon Spectroscopy of Hydrogen Rydberg States: Remeasurement of R? -- Two-Photon Transitions Between Discrete States --
Two-Photon Spectroscopy of Hydrogen 1S–2S -- 1S–2S Transition-Frequency Calibration -- High Resolution Spectroscopy of Hydrogen -- Trapped Atomic Hydrogen -- Atomic Hydrogen in a Magnetic Trapping Field -- Frequency Standards in the
Optical Spectrum -- Precision RF Spectroscopy of Circular Rydberg Atoms -- II Positronium, Muonium, and Other Hydrogen-Like Systems -- Laser Spectroscopy of Positronium and Muonium -- Positronium Decay Rates -- New Schemes for the
Production and Spectroscopy of Positronium -- Some Recent Advances in Muonium -- Transitions in Muonic Helium Ions Induced Laser Radiation -- Positrons for Low Energy Antihydrogen Production -- Antihydrogen Positronium-Antiproton
Interaction -- Antiprotonic Hydrogen -- The Spectroscopy of Hydrogen-Like Highly Ionised Atoms -- IlI Quantum Electrodynamics and Beyond -- The Bound State Problem in QED -- Electron g — 2 and High Precision Determination of ? --
General QED/QCD Aspects of Simple Systems -- Search for Parity Nonconservation in Hydrogen -- IV Hydrogen in Strong Fields and Chaos -- Multiphoton Transition to the Continuum of Atomic Hydrogen -- Hydrogen in Strong DC and Low
Frequency Electric Fields — One Dimensional Atoms -- Hydrogen Atoms in Strong Magnetic Fields — in the Laboratory and in the Cosmos -- Theory of Chaos in the Atomic Hydrogen -- Quantum Chaos and the Hydrogen Atom in Strong Magnetic
Fields -- Highly Excited Hydrogen in Strong Microwaves: Experimental Tests for Classically Chaotic Semiclassical Dynamics and for Quantum Localization -- Quasi-Landau Spectrum of the Chaotic Diamagnetic Hydrogen Atom -- Index of
Contributors
ISBN:9783642884214
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Atoms , Optics , Optoelectronics , Plasmons (Physics) , Physics , Atomic, Molecular, Optical and Plasma Physics , Optics, Optoelectronics, Plasmonics and Optical Devices
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Call number:SPRINGER-1985-9783642707803:ONLINE Show nearby items on shelf
Title:Picosecond Electronics and Optoelectronics Proceedings of the Topical Meeting Lake Tahoe, Nevada, March 13–15, 1985
Author(s):
Date:1985
Size:1 online resource (258 p.)
Note:10.1007/978-3-642-70780-3
Contents:I Ultrafast Optics and Electronics -- Ultrafast Optical Electronics: From Femtoseconds to Terahertz. (With 3 Figures) -- Prospects of High-Speed Semiconductor Devices. (With 6 Figures) -- The Role of Ultrashort Optical Pulses in
High-Speed Electronics. (With 2 Figures) -- GaAs Integrated Circuit Technology for High Speed Analog and Digital Electronics. (With 7 Figures) -- Heterojunction Bipolar Transistor Technology for High-Speed Integrated Circuits. (With 5
Figures) -- Permeable Base Transistor. (With 6 Figures) -- Two Dimensional E-Field Mapping with Subpicosecond Resolution. (With 4 Figures) -- Picosecond Electrooptic Sampling and Harmonic Mixing in GaAs. (With 3 Figures) --
Characterization of TEGFETs and MESFETs Using the Electrooptic Sampling Techniques. (With 4 Figures) -- Picosecond Electro-Electron Optic Oscilloscope. (With 5 Figures) -- Picosecond Optoelectronic Diagnostics of Field Effect
Transistors. (With 4 Figures) -- Time-Domain Measurements for Silicon Intergrated Circuit Testing Using Photoconductors. (With 3 Figures) -- Modeling of Picosecond Pulse Propagation on Silicon Integrated Circuits. (With 4 Figures) --
II High-Speed Phenomena in Bulk Semiconductors -- Picosecond Processes in Carrier Transport Theory. (With 4 Figures) -- Carrier-Carrier Interaction and Picosecond Phenomena in Polar Semiconductors. (With 4 Figures) -- Subpicosecond
Raman Spectroscopy of Electron-LO Phonon Dynamics in GaAs. (With 3 Figures) -- Acoustic Phonon Generation in the Picosecond Dynamics of Dense Electron-Hole Plasmas in InGaAsP Films. (With 3 Figures) -- Picosecond Time-Resolved
Photoemission Study of the InP (110) Surface. (With 2 Figures) -- Monte Carlo Investigation of Hot Carriers Generated by Subpicosecond Laser Pulses in Schottky Barrier Diodes. (With 2 Figures) -- III Quantum Structures and Applications
-- Properties of GaAlAs/GaAs Quantum Well Heterostructures Grown by Metalorganic Chemical Vapor Deposition -- Molecular Beam Epitaxy Materials for High-Speed Digital Heterostructure Devices. (With 4 Figures) -- New High-Speed Quantum
Well and Variable Gap Superlattice Devices. (With 18 Figures) -- Electric Field-Induced Decrease of Exciton Lifetimes in GaAs Quantum Wells. (With 2 Figures) -- Reduction of Electron-Phonon Scattering Rates by Total Spatial
Quantization. (With 3 Figures) -- Hot Electron Diffusion in Superlattices. (With 3 Figures) -- Time-Resolved Photoluminescence of GaAs/AlxGa1?xAs Quantum Well Structures Grown by Metal-Organic Chemical Vapor Deposition. (With 5
Figures) -- A Study of Exciton and Carrier Dynamics and a Demonstration of One-Picosecond Optical NOR Gate Operation of a GaAs-AlGaAs Device. (With 2 Figures) -- Exciton-Exciton Interaction in GaAs-GaAlAs Superlattices. (With 3
Figures) -- IV Picosecond Diode Lasers -- An InGaAsP 1.55 ?m Mode-Locked Laser with a Single-Mode Fiber Output. (With 7 Figures) -- Fast Multiple Quantum Well Absorber for Mode Locking of Semiconductor Lasers. (With 3 Figures) --
Suppression of Timing and Energy Fluctuations in a Modelocked Semiconductor Laser by cw Injection. (With 5 Figures) -- Parametric Oscillations in Semiconductor Lasers -- V Optoelectronics and Photoconductive Switching -- Ultrafast
Traveling-Wave Light Modulators with Reduced Velocity Mismatch. (With 4 Figures) -- Modulation of an Optical Beam by a Second Optical Beam in Biased Semi-Insulating GaAs. (With 6 Figures) -- 22-GHz Bandwidth InGaAs/InP PIN Photodiodes
(With 4 Figures) -- An Ultrafast Diffusion-Driven Detector. (With 1 Figure) -- Picosecond Photoconductivity in Polycrystalline CdTe Films Prepared by UV-Enhanced OMCVD. (With 3 Figures) -- High-Speed Internal Photoemission Detectors
Enhanced by Grating Coupling to Surface Plasma Waves. (With 3 Figures) -- Submicron-Gap Photoconductive Switching in Silicon. (With 4 Figures) -- Hertzian Dipole Measurements with InP Photoconductors. (With 3 Figures) -- Pulse Waveform
Standards for Electro-Optics -- High-Speed Optoelectronic Track-and-Hold Circuits in Hybrid Signal Processors for Wideband Radar. (With 4 Figures) -- Optoelectronic Modulation of Millimeter Waves in a Silicon-on-Sapphire Waveguide.
(With 4 Figures) -- Direct DC to RF Conversion by Impulse Excitation of a Resonant Cavity. (With 4 Figures) -- Kilovolt Sequential Waveform Generation by Picosecond Optoelectronic Switching in Silicon. (With 4 Figures) -- Femtosecond
Nonlinearities of Standard Optical Glasses. (With 3 Figures) -- VI Cryoelectronics -- High-Speed Analog Signal Processing with Superconductive Circuits. (With 7 Figures) -- Picosecond Sampling with Josephson Junctions. (With 5 Figures)
-- Transmission Line Designs with a Measured Step Response of 3ps per Centimeter. (With 5 Figures) -- Development of a Picosecond Cryo-Sampler Using Electro-Optic Techniques. (With 4 Figures) -- Picosecond Josephson Logic Gates for
Digital LSIs. (With 5 Figures) -- Index of Contributors
ISBN:9783642707803
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Electrophysics: 21
Keywords: Engineering , Optics , Optoelectronics , Plasmons (Physics) , Electronics , Microelectronics , Engineering , Electronics and Microelectronics, Instrumentation , Optics, Optoelectronics, Plasmonics and Optical Devices
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Call number:NEC-2017::2016 Show nearby items on shelf
Title:Analysis of changes NEC-2017 National Electrical Code 2017
Author(s): L. Keith Lofland
Date:2016
Publisher:International Association of Electrical Inspectors
Size:592 p
Contents:Introduction. -- General, articles 100-110. -- Wiring and protection, articles 210-250. -- Wiring methods, articles 300-370. -- Equipment for general use, articles 404-480. -- Special occupancies, articles 500-590. -- Special equipment, articles 600 -695. -- Special conditions, articles 700-770. -- Communications systems, articles 810-840. -- Tables and Annex D.
ISBN:9781890659721
Keywords: Electric standards , Electrical engineering
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Call number:NEC-2014.SB::2013 Show nearby items on shelf
Title:Analysis of changes NEC 2014
Author(s): National Electrical Code
Date:2013
Publisher:National Electrical Code Committee
Size:368 p
ISBN:9781890659646
Keywords: Electric standards , Electrical engineering
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