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SPIRES-BOOKS: FIND KEYWORD GLASS COATINGS *END*INIT* use /tmp/qspiwww.webspi1/5714.6 QRY 131.225.70.96 . find keyword glass coatings ( in books using www Cover
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Call number:TP858.P84::1999 Show nearby items on shelf
Title:Coatings on Glass
Author(s): Hans K. Pulker
Date:1999
Publisher:Elsevier
ISBN:9780444501035
Keywords: Glass coatings.
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Call number:SPRINGER-2012-9781461409250:ONLINE Show nearby items on shelf
Title:Biomimetics in Materials Science [electronic resource]
Author(s): Michael Nosonovsky
Pradeep K. Rohatgi
Date:2012
Edition:1
Publisher:Springer New York
Size:1 online resource
Note:Monograph
Note:Springer 2012 Physics and Astronomy eBook collection
Note:Springer e-book platform
ISBN:9781461409250
Series:Springer Series in Materials Science
Series:e-books
Keywords: Continuum Mechanics and Mechanics of Materials , Polymer Sciences , Tribology, Corrosion and Coatings , Ceramics, Glass, Composites, Natural Materials , Metallic Materials
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Call number:SPRINGER-2005-9783540266679:ONLINE Show nearby items on shelf
Title:Excimer Laser Technology [electronic resource]
Author(s): Dirk Basting
Gerd Marowsky
Date:2005
Publisher:Berlin, Heidelberg : Springer Berlin Heidelberg
Size:1 online resource
Note:Springer e-book platform
Note:Springer 2013 e-book collections
Note:This comprehensive survey on Excimer Lasers investigates the current range of the technology, applications and devices of this commonly used laser source, as well as the future of new technologies, such as F2 laser technology.Additional chapters on o ptics, devices and laser systems complete this compact handbook. A must read for laser technology students, process application researchers, engineers or anyone interested in excimer laser technology. Aneffective and understandable introduction to the cur rent and future status of excimer laser technology
Note:Springer eBooks
Contents:Introduction
Part I Fundamentals: Some Fundamentals of Laser Physics
Principles of Excimer Lasers
Design and Technology of Excimer Lasers
Specially Designed Excimer Lasers
Excimer Lasers for Microlithography
Laser Beam Characterization
Optical Coatings for Excimer Laser Applications
Small Structures with Large Excimer Lasers
Part II Applications: Overview
Ablative Micro
Fabrication
Micro
Processing of Borosilicate Glass and Polymers
F2
Laser Microfabrication for Photonics and Biophotonics
Nano
Structuring with Femtosecond Excimer Laser Pulses
Physical
ISBN:9783540266679
Series:e-books
Series:SpringerLink (Online service)
Series:Physics and Astronomy (Springer-11651)
Keywords: Chemistry, Physical organic , Weights and measures , Electromagnetism , Laser physics
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Call number:SPRINGER-2003-9783662034750:ONLINE Show nearby items on shelf
Title:Thin Films on Glass
Author(s):
Date:2003
Size:1 online resource (436 p.)
Note:10.1007/978-3-662-03475-0
Contents:1. Overview — Thin Films on Glass: an Established Technology -- 2. Design Strategies for Thin Film Optical Coatings -- 3. Coating Technologies -- 4. Properties and Characterization of Dielectric Thin Films -- 5. Developments at
Schott: Selected Topics -- 6. Products -- List of Contributors -- Sources of Figures and Tables
ISBN:9783662034750
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Materials science , Physical chemistry , Engineering , Materials , Thin films , Materials Science , Surfaces and Interfaces, Thin Films , Physical Chemistry , Engineering, general , Characterization and Evaluation of Materials
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Call number:SPRINGER-2001-9783540449461:ONLINE Show nearby items on shelf
Title:Advances in Solid State Physics
Author(s):
Date:2001
Size:1 online resource (644 p.)
Note:10.1007/3-540-44946-9
Contents:Quantum Dots -- A Quantum Dot Single Photon Source -- Control of Light in Microresonators -- Numerical Renormalization Group Analysis of Interacting Quantum Dots -- Few-Particle Effects in Self-Organized Quantum Dots -- Spectroscopy
on Single Dots — Monitoring Carrier Interaction with the Environment -- Optical Spectroscopy on Single Quantum Dots: Charged Excitons -- Long-Wavelength Buried-Tunnel-Junction Vertical-Cavity Surface-Emitting Lasers -- Optics -- Photon
Echo Experiments on Electron-Plasmon Quantum Kinetics in GaAs -- Phonon and Coulomb Quantum Kinetics for Femtosecond Spectroscopy -- Quantum Kinetic Effects in Semiconductors Studied via Femtosecond Transmission Measurements -- Phonon
Quantum Kinetics in Spatially Inhomogeneous Systems -- Propagating Anisotropic Solitons in Active Semiconductor Media -- Photorefractive Spatial Solitons -- X-Ray Magneto-Optics -- Electron and Spin Transport -- Spintronics: Spin
Electronics and Optoelectronics in Semiconductors -- Transport in Quasi One-Dimensional Systems -- Transport in Nanostructures: A Comparison between Nonequilibrium Green Functions and Density Matrices -- Spin-Orbit Coupling in
Two-Dimensional Electron and Hole Systems -- Nanostructures -- Lanthanide-Silicide Films on Silicon Surfaces -- Development of Texture and Microstructure in MgO Buffer Layers Using Ion-Beam Assisted Pulsed Laser Deposition -- Modelling
of Structure Formation and Mechanical Stresses during Growth of Vapor Deposited Amorphous Thin Films -- Some Materials Science Aspects of PVD Hard Coatings -- X-Ray Diffraction and X-Ray Reflectivity Applied to Investigation of Thin
Films -- Three-Dimensional Electric Field Probing of Ferroelectrics on the Nanometer Scale Using Scanning Force Microscopy -- Superconducting Systems -- Terahertz Hilbert Spectroscopy by High-T c Josephson Junctions -- Discrete
Breathers in Condensed Matter -- Quantum Phase Transitions and Collective Modes in d-Wave Superconductors -- Complex Systems -- Physics in Cell Biology: Actin as a Model System for Polymer Physics -- The Wonderful World of Active
Many-Particle Systems -- Pattern Formation in Dissipative Systems: A Particle Approach -- Structure Formation by Aggregation: Models and Applications -- Amorphous Thin Film Growth: Modeling and Pattern Formation -- Dynamic Processes at
the Glass Transition -- Semiclassical Theory -- The Trace Formula between Classical and Quantum Mechanics -- Tunneling in Complex Systems and Periodic Orbits -- The Gutzwiller Trace Formula for Quantum Systems with Spin --
Semiclassical Description of Shell Effects in Finite Fermion Systems -- Quantum Signatures of Typical Chaotic Dynamics -- The Semiclassical Tool in Complex Physical Systems: Mesoscopics and Decoherence -- Cohesion and Stability of
Metal Nanowires: A Quantum Chaos Approach -- Magnetism -- Magnetochemistry: Compounds and Concepts -- Lorentz Electron Microscopic Observation of Micromagnetic Configurations in Nanostructured Materials -- Laser-Control of Ferro- and
Antiferromagnetism -- Spin-Polarized Photoelectron Emission Microscopy of Magnetic Nanostructures -- Study of Excitations in Structurally Incommensurately Modulated Solids by Means of Nuclear Magnetic Resonance -- High Resolution X-Ray
Detection Using Metallic Magnetic Calorimeters -- Magnetotransport Properties of Thin Films of Magnetic Perovskites -- Dynamics of Ferroelectric Domain Walls -- Magnetic Nanoparticles: The Simulation of Thermodynamic Properties --
Micromagnetic Simulation of Switching Events
ISBN:9783540449461
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Advances in Solid State Physics Volume 41: 41
Keywords: Physics , Polymers , Solid state physics , Superconductivity , Superconductors , Optical materials , Electronic materials , Materials science , Materials , Thin films , Physics , Solid State Physics , Optical and Electronic Materials , Surfaces and Interfaces, Thin Films , Strongly Correlated Systems, Superconductivity , Characterization and Evaluation of Materials , Polymer Sciences
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Call number:SPRINGER-1998-9783709175064:ONLINE Show nearby items on shelf
Title:Modern Developments and Applications in Microbeam Analysis
Author(s):
Date:1998
Size:1 online resource (392 p.)
Note:10.1007/978-3-7091-7506-4
Contents:Recent Developments in Instrumentation for X-Ray Microanalysis -- High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors -- Efficiency Calibration of a Si(Li) Detector by EPMA --
Wavelength-Dispersive X-Ray Spectrometry -- X-Ray Spectrum Processing and Multivariate Analysis -- Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope -- On the Spatial Resolution in Analytical Electron
Microscopy -- Contamination in Analytical Electron Microscopy and in ALCHEMI -- Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at. % Zn Alloy -- Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials --
Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide Microbeam Investigations -- Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and
Microcrystals -- Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs -- SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation -- Surface Characterisation and Modification of YBCO Thin Films by STM --
Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA -- EPMA Sputter Depth Profiling, Part I: Theory and Evaluation -- EPMA Sputter Depth Profiling, Part II: Experiment -- Quantitative Analysis of BN (C, O, Ar,
H)-Coatings Using EPMA and SIMS -- Quantitative EDS Analysis of SiO2/Al2O3/TiO2 Multilayer Films -- Surface Ionization of Thin Films on Substrates: Measurement and Simulation -- Comparison of Different Methods to Characterize Thin
a-Si:H Films -- EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation -- Analysis of Thin Films with Slightly Rough Boundaries -- Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour
Deposition Method -- EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs -- EPMA of Melted UO2 Fuel Rods from the Phebus-FP Reactor Accident Experiment -- Steels, Carbon Concentration, and Microhardness -- Determination
of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods -- EPMA of the Composition of Opal-Based Nanostructured Materials -- NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas --
Compositional X-Ray Maps of Metamorphic and Magmatic Minerals -- Chemical Mapping of Weathering Stages in Laterites -- Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides
and Sulpharsenides: Problems, Solutions, and Applications -- Composition of 15–17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium -- Potassium Migration in Silica Glass During Electron Beam Irradiation -- X-Ray
Microanalysis of Frozen-Hydrated Biological Bulk Samples -- Environmental SEM and X-Ray Microanalysis of Biological Materials -- Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM -- The
Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam -- Standardless Analysis -- A New Technique for Standardless Analysis by EPMA-TWIX -- Stopping Power Factor for Standardless QEPMA -- On the
Measurement of the Backscattering Coefficient for Low Energy Electrons -- Monte Carlo Simulations of Edge Artefacts in MULSAM Images -- Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations -- A Rapid Comparison of
Matrix Corrections in AES and XPS by Means of Computer Programs -- Fractals and BaTiO3-Ceramic Microstructure Analysis -- Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies --
Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions -- The Standards, Measurements and Testing Programme (SMT), the European Support to
Standardisation, Measurements and Testing Projects
ISBN:9783709175064
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta Supplement: 15
Keywords: Materials science , Analytical chemistry , Materials Science , Characterization and Evaluation of Materials , Analytical Chemistry
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Call number:SPRINGER-1996-9783709165553:ONLINE Show nearby items on shelf
Title:Microbeam and Nanobeam Analysis
Author(s):
Date:1996
Size:1 online resource (4 p.)
Note:10.1007/978-3-7091-6555-3
Contents:Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis -- Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications -- Use of Soft X-Rays in Microanalysis -- Intensity Measurement of
Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region -- Synchrotron Radiation Induced X-ray Microfluorescence Analysis -- Particle-Induced X-Ray Emission — A Quantitative Technique Suitable for
Microanalysis -- Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materials -- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) -- Three-Dimensional Nanoanalysis with the
Tomographic Atom-Probe -- Microanalysis at Atomic Resolution -- Composition of Vanadium Carbides Formed by Solidification in Fe-V-C-M Alloys: Influence of Additions (M = Al, Cu, Mo) -- Electron Transmission Coefficient for Oblique
Angle of Incidence -- Depth Distribution Function for Oblique Angle of Incidence -- Simulation of EDS Spectra Using X-RES Software -- On the Use of the GeL? Line in Thin Film X-Ray Microanalysis of Si1-x Gex/Si Heterostructures --
Computer Simulations of the X-Ray Intensity Distribution from Submicron Particles Embedded in a Matrix -- Determination of Rare Earth Elements in Biological and Mineral Apatite by EPMA and LAMP-ICP-MS -- Quantitative Analysis of the
Compound Layer of Plasma Nitrided Pure Iron -- Correction of the Edge Effect in Auger Electron Microscopy -- Low Energy Imaging of Nonconductive Surfaces in SEM -- Investigation of the Bonding Mechanism of Glass Ceramic Layers on Metal
Alloys -- Monte Carlo Method for Quantitative Analysis of Bulk and Layered Samples -- SIMS Linescan Profiling of Chemically Bevelled Semiconductors: a Method of Overcoming Ion Beam Induced Segregation in Depth Profiling -- Experimental
Verification of Theoretical Models Simulating the Temperature Increase in EPMA of Glass -- Quantitation of Mineral Elements of Different Fruit Pollen Grains -- Electron Beam Induced Migration of Alkaline Ions in Silica Glass --
Application of the Boltzmann Transport Equation in the Thickness Determination of Thin Films -- Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images -- Calculation of
the Surface Ionisation Using Analytical Models of Electron Backscattering -- Thickness Determination of Thin Insulating Layers -- High Energy and Angular Resolution Dynamic Secondary Ion Mass Spectrometry -- EPMA and Mass Spectrometry
of Soil and Grass Containing Radioactivity from the Nuclear Accident at Chernobyl -- Application of a New Monte Carlo Simulation Algorithm to Electron Probe Microanalysis -- Topography Development on Single Crystal MgO Under Ion Beam
Bombardment -- Determination of SPM TIP Shape Using Polystyrene Latex Balls -- Combined Characterization of Nanostructures by AEM and STM -- Study of Quasi-Fractal Many-Particle-Systems and Percolation Networks by Zero-Loss
Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Digital Image Analysis -- Calculation of Bremsstrahlung Spectra for Multilayer Samples -- Thickness Measurement of Thin Films by EPMA — Influence of ? (0), MAC’s and
Substrate -- A Simple Procedure to Check the Spectral Response of an EDX Detector -- Virtual WDS -- Monte Carlo Simulation Program with a Free Configuration of Specimen and Detector Geometries -- Barriers to Energy Dispersive
Spectrometry with Low Energy X-Rays -- Measurements of Ga1-xAlxAs Layers on GaAs with EDS -- The Relative Intensity Factor for La Radiation Considering the Different Mass Absorption of La and L? Radiation -- Determination of the
Solubility of Cerium in BaTiO3 by Quantitative WDS Electron Probe Microanalysis -- Simulation of X-Ray Diffraction Profiles of Gradually Relaxed Epilayers -- Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures
Using a Modified Quadtree Geometry Discretization -- Chemical-Bond Characterization of Nanostructures by EELS -- Local Determination of Carbon by Combining Beta-Autoradiography and Electron Microprobe Analysis -- The Check of the
Elastic Scattering Model in Monte-Carlo Simulation -- True Colour X-Ray Vision for Electron Microscopy and Microanalysis -- Determination of the Oxidation States of Nb by Auger Electron Spectroscopy -- Study by SIMS of the 54Cr and 18O
Diffusion in Cr2 O3 and in Cr2O3 Scales -- Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings -- Electron Probe X-Ray Microanalysis of
Coatings -- Analysis of Layers: X-Ray Maps of Change in Thickness Obtained by Electron Macroprobe -- Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Siin Absolute Units -- Practical Aspects and Applications
of EPMA at Low Electron Energies -- Oxidation and Reduction Processes of Be/BeO Induced by Electrons
ISBN:9783709165553
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta Supplement: 13
Keywords: Chemistry , Analytical chemistry , Physical chemistry , Solid state physics , Optics , Optoelectronics , Plasmons (Physics) , Spectroscopy , Microscopy , Materials , Thin films , Chemistry , Analytical Chemistry , Physical Chemistry , Solid State Physics , Spectroscopy and Microscopy , Optics, Optoelectronics, Plasmonics and Optical Devices , Surfaces and Interfaces, Thin Films
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Call number:SPRINGER-1995-9781461395355:ONLINE Show nearby items on shelf
Title:Quantitative X-Ray Diffractometry
Author(s): Lev S Zevin
Date:1995
Size:1 online resource (70 p.)
Note:10.1007/978-1-4613-9535-5
Contents:1 Introduction -- 1.1 Phase analysis—when and why -- 1.2 Phase analysis as an analytical method -- 1.3 History of quantitative X-ray phase analysis -- 2 Physical basis -- 2.1 Interaction of X-rays with material -- 2.2 Intensity in
powder diffraction -- 2.3 Background—angle variation and intensity -- 2.4 X-ray diffraction by nonhomogeneous polycrystalline materials -- 2.5 Orientation of reflecting particles -- 3 Geometric aspects of X-ray diffractometry -- 3.1
Geometric schemes in X-ray diffractometry -- 3.2 Diffractometers with Bragg-Brentano reflection focusing -- 3.3 Diffractometers with Seeman-Bohlin reflection focusing -- 3.4 Transmission technique with constant specimen-detector
distance (Bragg-Brentano transmission analog) -- 3.5 Transmission technique with an invariant focusing circle (Guinier diffractometer or the Seeman-Bohlin transmission analog) -- 3.6 Debye-Sherrer geometry -- 3.7 Powder diffractometry
with synchrotron radiation -- 3.8 Position-sensitive detectors in powder diffractometry -- 4 Methodology of quantitative phase analysis -- 4.1 Introduction -- 4.2 Analysis of samples with a known mass absorption coefficient
(diffraction-absorption technique) -- 4.3 Internal standard method -- 4.4 Doping method in quantitative X-ray diffractometry -- 4.5 Dilution Method -- 4.6 Full-phase analysis of the n-phase sample -- 4.7 Reference intensity ratios in
quantitative analysis -- 4.8 Diffraction patterns with overlapping peaks—full diffraction pattern approach -- 4.9 Implementation of calculated powder patterns in QXRD -- 4.10 Standardless Methods -- 4.11 Combination of X-ray
diffraction and chemical data -- 4.12 Crystallinity of polymers -- 4.13 Analysis of low-mass samples -- 5 Practical aspects of quantitative phase analysis -- 5.1 Introduction -- 5.2 Instrumentation -- 5.3 Specimen preparation -- 5.4
Analytical standards -- 5.5 Intensity measurements -- 5.6 Definition and subtraction of background -- 5.7 Determination of sample absorption -- 5.8 Pattern decomposition and simulation -- 5.9 Methodology of corrections for preferred
orientation -- 5.10 Estimation of analysis errors -- 5.11 Detection limit -- 5.12 Crystallite statistics -- 6 Industrial applications -- 6.1 Ceramics and glass ceramics -- 6.2 Naturally occurring (geologic) samples -- 6.3 Analysis of
Portland cement -- 6.4 Metallurgy -- 6.5 Thin films and coatings -- 6.6 Air pollution (aerosols and airborne dusts) -- 6.7 Pharmaceuticals -- References
ISBN:9781461395355
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Crystallography , Physics , Crystallography
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Call number:SPRINGER-1985-9783709188408:ONLINE Show nearby items on shelf
Title:Progress in Materials Analysis Vol. 2
Author(s):
Date:1985
Size:1 online resource (382 p.)
Note:10.1007/978-3-7091-8840-8
Contents:Surface Characterization of Thin Organic Films on Metals -- Analysis of Very Thin Organic Fibres by Means of Small Spots Electron Spectroscopy for Chemical Analysis -- Ion Implantation in the Surface Analysis of Solid Materials --
Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations -- Microfocussed Ion Beams for Surface Analysis and Depth Profiling -- Secondary Neutral Mass Spectrometry Depth Profile
Analysis of Silicides -- Analysis of Thin Chromate Layers on Aluminium. I. Opportunities and Limitations of Surface Analytical Methods -- Analysis of Thin Chromate Layers on Aluminium. II. Structure and Composition of No-rinse
Conversion Layers -- Surface Analytical Investigation of the Corrosion Behaviour of Ti(Pd) Samples -- Determination of the Lubricant Thickness Distribution on Magnetic Disks by Means of X-Ray Induced Volatilization and Simultaneous
Photoelectron Spectroscopy -- Internal Quantification of Glow Discharge Optical Spectroscopy-Depth Profiles of Oxide and Nitride Layers on Metals -- Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses --
Neutral Primary Beam Secondary Ion Mass Spectrometry Analysis of Corrosion Phenomena on Glass Surfaces -- Quantitative Distribution Analysis of Phosphorus in Silicon with Secondary Ion Mass Spectrometry -- Positron Studies of Defects
in Metals and Semiconductor -- Kossel Technique and Positron Annihilation Used to Clarify Sintering Processes -- Selection and Qualification Tests of High Temperature Materials by Special Microanalytical Methods -- On the Application
of Acoustic Emission Analysis to Evaluate the Integrity of Protective Coatings t on High-Temperature Alloys -- Microprobe Measurements to Determine the Melt Equilibria of High-Alloy Nickel Materials -- Experimental Determination of the
Depth Distribution of X-Ray Production ?(?z) for X-Ray Energies Below 1 keV -- Electron Probe Microanalysis of Oxygen and Determination of Oxide Film Thickness Using Gaussian ?(?z) Curves -- Procedures to Optimize the Measuring Methods
in the Electron Probe Microanalysis of Low Energy X-Rays -- Quantitative Microstructural Analysis of Sintered Silicon Nitride by Using a Thin-Window Energy Dispersive X-Ray Detector System -- Optimizing the Microstructure of Implant
Alloy TiA15Fe2.5 by Microprobe Analysis -- Characterization of Technical Surfaces With a Coupled SEM-EDA-Image Analyzer System -- Microanalytical Characterization of a Powder Metallurgical Ledeburitic Tool Steel by Transmission
Electron Microscopy -- Determination of the Bonding Behaviour of Carbon and Nitrogen in Micro-Alloyed Structural Steels -- Analytical Electron Microscopy of Rare-Earth Permanent Magnet Materials
ISBN:9783709188408
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta Supplementum, Proceedings of the 12th Colloquium on Materials Analysis, Institute for Analytical Chemistry, Technical University in Vienna, May 13–15, 1985: 11
Keywords: Chemistry , Analytical chemistry , Chemistry , Analytical Chemistry
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Call number:SPRINGER-1984-9781461324355:ONLINE Show nearby items on shelf
Title:Adhesive Chemistry Developments and Trends
Author(s):
Date:1984
Size:1 online resource (871 p.)
Note:10.1007/978-1-4613-2435-5
Contents:One: Chemistry of Adhesion — The Importance of Interface -- Introductory Remarks -- Recent Developments in Adhesive and Sealant Chemistry -- Overview of Adherence Phenomena -- An Analytical Method for Determining the Surface Energy of
Solid Polymers -- Effect of Amine Surface Treatment on the Adhesion of Polyurethane to the Surface -- Effect of Silane on Glass/Resin Adhesion Strength -- Discussion -- Two: Physics of Adhesion — Characterization of Surface and Bulk of
Adhesive Systems -- Introductory Remarks -- New Applications of ESCA -- Fracto-Emission Accompanying Adhesive Failure -- Monitoring Epoxy Cure Kinetics with a Viscosity-Dependent Fluorescent Probe -- Dynamic Mechanical Properties of
Silicone Pressure Sensitive Adhesives -- The Viscoelastic Properties of Pressure-Sensitive Adhesives -- Block Copolymer Adhesive Studies -- Discussion -- Three: Radiation-Curable Adhesives -- Introductory Remarks -- Ultraviolet Cured
Pressure-Sensitive Adhesives -- Recent Progress in Photoinitiated Cationic Polymerization -- Polymer and Formulation Design Characteristics for Developing Bonding Capabilities of Radiation-Curable Coatings and Adhesive Systems --
Dynamic Thermal Analysis Characterizations of Electron-Beam Cured Adhesives -- Reactive Butadiene/Acrylonitrile Liquid and Solid Elastomers: Formulating Acrylic, Anaerobic, and Radiation-Curable Adhesives -- Photoinitiators: A Review
of Mechanisms and Applications -- Discussion -- Four: High Temperature Adhesives -- Introductory Remarks -- Status of High Temperature Adhesives -- Polyimide Adhesives: Modified with ATBN and Silicone Elastomers -- The Application of
Thermodynamic and Spectroscopic Techniques to Adhesion in the Polyimide/Ti 6–4 and Polyphenyl-quinoxaline/Ti 6–4 Systems -- Evaluation of High Temperature Structural Adhesives for Extended Service -- Aminosilane and Metal Modifications
of Polyimide Surfaces -- Influence of Molecular Weight on Fracture Behavior of Polyphenylquinoxaline Thermosets -- Discussion -- Five: Anaerobic and Structural Adhesives -- Introductory Remarks -- Some Recent Developments in Scanning
Electron Microscopy -- Potential Anaerobic and Structural Acrylic Modified Polyester Adhesives -- Anaerobic Adhesives Containing Maleimides Having Improved Thermal Resistance -- Chemistry of Accelerators for Curing Anaerobic Adhesives
— Reaction of N,N-Dimethylaniline Derivatives with Cumene Hydroperoxide -- Chemistry, Physical Properties and Durability of Structural Adhesive Bonds -- Reactive Butadiene/Acrylonitrile Liquid and Solid Elastomers: A Bibliography for
Formulating Epoxy Structured Adhesives -- A Low Curing Temperature CTBN-Toughened Epoxy Adhesive -- Summarizing Remarks -- Discussion -- Six: Trends in Adhesive Research -- Developments in and Limitations of Adhesive Materials for
Severe Environments and a Long Service Life -- Elastomers and Resin Modifiers for Water-Base Adhesives -- “Aerobic” Acrylic Adhesives— New Technology in Acrylic Adhesives -- Radiant Energy Curable Adhesives -- Isocyanatoethyl
Methacrylate: A Latent Cross linker for Coating Adhesive Resins -- Moisture Permeation of Polymer Sealants and Interface Modifying Films -- ESCA and AES Studies of the Interfacial Chemical Bonding between Aluminum and Chromium (III)
Fumarato-Coordination Compound -- Adhesive Research in China -- Discussion -- Contributors -- Author Index
ISBN:9781461324355
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Polymer Science and Technology: 29
Keywords: Chemistry , Organic chemistry , Polymers , Chemical engineering , Chemistry , Organic Chemistry , Polymer Sciences , Industrial Chemistry/Chemical Engineering
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Call number:SPRINGER-1979-9781468434927:ONLINE Show nearby items on shelf
Title:Fiber Optics Advances in Research and Development
Author(s):
Date:1979
Size:1 online resource (693 p.)
Note:10.1007/978-1-4684-3492-7
Contents:Section I: Fiber Materials and Processing -- Vapor Phase Materials and Processes for Glass Optical Waveguides -- Fiber Drawing Process: Characterization and Control -- Analytical Techniques for the Prediction of the Fiber Forming
Process -- An Overview of Optical Waveguide Coatings -- Infrared Fiber Optical Materials -- Fabrication of Silver Halide Fibers by Extrusion -- Section II: Strengthening of Fibers -- High Strength Furnace-Drawn Optical Fibers -- High
Strength CVD Fibers -- Strengthening of Optical Fibers by Molecular Stuffing -- Effect of Zero Stress Aging on the Strength of Optical Fibers -- Fracture Surface Analysis of Optical Fibers -- Section III: Optical Phenomena and
Characterization -- Nonlinear Effects in Optical Fibers: Application to the Fabrication of Active and Passive Devices -- Forward and Backward Stimulated Raman Scattering in a Multimode Fiber -- Fiber Parameter Studies with the OTDR --
Refractive Index Modulation in Optical Fibers Fabricated by the Vapor Oxidation Process -- Section IV: Propagation Theory -- Propagating Fields in Graded Index Optical Fibers -- Modes of Weakly Guiding Fibers by an Integral
Representation Technique -- Propagation of Nonlinear Optical Pulses in Fibers -- Solitons in the Theory of Guided Lightwaves -- Section V: Radiation Effects -- Radiation-Induced Optical Absorption Spectra of Fiber Optic Waveguides in
the 0.4–1.7 ? Region -- Optical Absorption Spectra of Neutron Irradiated Optical Fibers in the 0.7–1.1 ?m Region -- Neutron- and Gamma-Induced Transient Effects in Optical Fibers -- Section VI: Switching and Coupling -- Bistable
Optical Devices: An Overview -- Multimode 3X2 Fiber-Optical Matrix Switch -- Ultrafast Optically Activated Switching in Semiconducting Materials -- Fiber Connectors, Splices and Couplers -- Access Couplers for Single Strand Systems --
Section VII: Components and Systems -- Fiber Optic System Design and Component Selection -- Light Wave Transmission Systems for Telecommunication Application -- Semiconductor Light Sources for Fiber Optical Communication -- Section
VIII: Novel Applications -- Novel Applications of Fiber Optics -- Utilization of Optical Fibers in Remote Inelastic Light Scattering Probes -- Optical Fiber Acoustic Sensors -- Optical Fiber Acoustic Sensor
ISBN:9781468434927
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Optics , Optoelectronics , Plasmons (Physics) , Physics , Optics, Optoelectronics, Plasmonics and Optical Devices
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