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SPIRES-BOOKS: FIND KEYWORD HEAT TRANSMISSION MEASUREMENT *END*INIT* use /tmp/qspiwww.webspi1/32634.200 QRY . find keyword heat transmission measurement ( in books using www Cover
Call number:9780470172599:ONLINE Show nearby items on shelf
Title:Handbook of numerical heat transfer
Author(s): W. J. (ed.) Minkowycz
E. M. (ed.) Sparrow
Jayathi (ed.) Murthy
Edition:2nd. ed.
Publisher:Hoboken, N.J. : Wiley
Size:1 online resource (968 p.)
Series:Wiley Online Library
Keywords: Heat Transmission Measurement , Handbooks , Manuals
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Call number:TH7687.A1IN8::1971 Show nearby items on shelf
Title:Heat transfer: non-stationary heat transfer through walls, measurement of thermal conductivity, heat transfer with two phase refrigerants. Current applications of air conditioning: testing air treatment equipment, topical problems and special applications of air conditioning. Echanges thermiques: transmission de chaleur en regime variable dans les parois, mesures de conductivite thermique, echanges thermiques avec les fluides frigorigenes biphases. Actualites en conditionnement d'air: essais des equipements de traitement d'air, problemes d'actualite et applications speciales du conditionnement d'air.
Author(s): International Institute of Refrigeration
Edition:[1st ed.]
Publisher:Pergamon Press, Oxford
Series:Refrigeration science and technology. Science et technique du froid 99-01
Keywords: Air conditioning Congresses. , Conference proceedings , Conferences
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Call number:SPRINGER-2003-9783642557538:ONLINE Show nearby items on shelf
Title:Mathematics — Key Technology for the Future Joint Projects between Universities and Industry
Size:1 online resource (732 p.)
Contents:I. Motors, Vehicles -- Synthesis of Automotive Cams Using Multiple Shooting-SQP Methods for Constrained Optimization -- Numerical Optimization of Scavenging in Two-Stroke Engines with Transfer Ducts, an Exhaust Port and a Moving
Piston -- A Numerical Tool for Flow Simulation in a Wankel Motor -- An Efficient Navier-Stokes Solver for Automotive Aerodynamics -- Numerical Simulation of Exhaust Systems in Car Industry — Efficient Calculation of Radiation Heat
Transfer -- Combinatorial Optimization Techniques for Three-Dimensional Arrangement Problems -- Simulation of Test-drives of Automobiles at Driving Limit -- An Optimal Control Approach To Real-Time Vehicle Guidance -- Theoretical and
Experimental Studies of an S-Catamaran -- II. Environmental Technology -- Robust Error Estimators for Interface Problems Occuring in Transport Processes in Porous Media -- Modelling and Simulation of a Planned Bio-Chemical in situ
Remediation -- Influence of Surfactants on Spreading of Contaminants and Soil Remediation -- Improvement of Environment Observing Remote Sensing Devices by Regularization Techniques -- III. Flow, Transport and Reactions in
Technological Processes -- Stability Analysis for Reactors from Chemical Industry -- Heterogeneous Dynamic Process Flowsheet Simulation of Chemical Plants -- Numerical Simulation of Annular Chromatography -- Numerical Methods for
Parameter Estimation in Bingham-Fluids -- A Viscoelastic Turbulence Model Based on Renormalization Group Theory -- Modelling and Simulation of Capacitor Impulse Welding -- Analysis of Transport Processes for Layered Porous Materials
Used in Industrial Applications -- Modelling and Numerical Simulation of District Heating Networks with Time-Saving Solution Methods -- Sensitivity and Robustness Analysis for Construction and Monitoring of Tubine-Generator Shafts --
IV. Optics and Sensors -- Adaptive Multigrid Methods for the Vectorial Maxwell Eigenvalue Problem for Optical Waveguide Design -- Direct and Inverse Problems for Diffractive Structures — Optimization of Binary Gratings -- Computation
of Electromagnetic Fields for a Humidity Sensor -- V. Crystal Growth, Semiconductors -- Simulation of Industrial Crystal Growth by the Vertical Bridgman Method -- Numerical Simulation and Control of Industrial Crystal Growth Processes
-- Optimal Control of Sublimation Growth of SiC Crystals -- Mathematical Modelling and Numerical Simulation of Semiconductor Detectors -- Optimal Design of High Power Electronic Devices by Topology Optimization -- Modelling and
Simulation of Strained Quantum Wells in Semiconductor Lasers -- VI. Electronic Circuits -- Efficient Analysis of Oscillatory Circuits -- Modelling and Simulation of Power Devices for High-Voltage Integrated Circuits -- Finding
Beneficial DAE Structures in Circuit Simulation -- CHORAL — a Charge-Oriented Algorithm for the Numerical Integration of Electrical Circuits -- VII. Tomography, Image Analysis and Visualisation -- Reconstructing Crystalline Structures
from Few Images Under High Resolution Transmission Electron Microscopy -- Measurement of Paint Layer Thickness with Photothermal Infrared Radiometry -- Spatio-Temporal Current Density Reconstruction from EEG-/MEG-Data -- Signal
Correction in NMR Spectroscopy -- On Scattering of Ultrasonic Waves -- Smoothing of Tomographic Data and Hybrid Volume-Surface Visualisation -- Video Coding with Adaptive Vector Quantization and Rate Distortion Optimization -- VIII.
Statistical Methods in Medical Applications -- The Application of Statistical Methods of Meta-Analysis for Heterogeneity Modelling in Medicine and Pharmacy, Psychology, Quality Control and Assurance -- An Application for the Analysis
of Human Tremor Time-Series -- IX. Optimization in Design and Production -- Free Material Optimization -- Automatic Layout and Labelling of State Diagrams -- Optimization Problems in a Semi-Automatic Device for Cutting Leather --
Stochastic Programming for Power Production and Trading Under Uncertainty -- Scheduling Scarce Resources in Chemical Engineering -- X. Optimization in Traffic and Communication -- Duty Scheduling in Public Transit -- Rotation Planning
for the Continental Service of a European Airline -- Computer Aided Scheduling of Switching Engines -- Train Schedule Optimization in Public Rail Transport -- An Integrated Planning Approach for Cellular Radio Networks -- Author Index
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Mathematics , Chemometrics , Computer graphics , Computer mathematics , Visualization , Statistics , Applied mathematics , Engineering mathematics , Mathematics , Computational Science and Engineering , Visualization , Appl.Mathematics/Computational Methods of Engineering , Math. Applications in Chemistry , Computer Imaging, Vision, Pattern Recognition and Graphics , Statistics for Life Sciences, Medicine, Health Sciences
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Call number:SPRINGER-1992-9781461532866:ONLINE Show nearby items on shelf
Title:Compendium of Thermophysical Property Measurement Methods Volume 2 Recommended Measurement Techniques and Practices
Size:1 online resource (643 p.)
Contents:1. Axial Heat Flow Methods of Thermal Conductivity Measurement for Good Conducting Materials -- 2. Thermal Conductivity of loose-Fill Materials By a Radial-heat-Flow Method -- 3. The Measurement of Thermal Conductivity By the
Comparative Method -- 4. Reference Guarded Hot plate ApparatuS for the Determination of Steady-State Thermal Transmission Properties -- 5. Apparatus for Testing High-Temperature Thermal-Conductivity Standard Reference Materials With
Conductivities Above 1 W m-1K-1 in the Temperature Range 400 to 2500 K -- 6. The Probe Method for Measurement of Thermal Conductivity -- 7. B.S. 1902 Panel Test Method for the Measurement of the Thermal Conductivity of Refractory
Materials -- 8. The Variable-Gap Technique for Measuring Thermal Conductivity of Fluid Specimens -- 9. Methods for Electrical Resistivity Measurement Applicable to Medium and Good Electrical Conductors -- 10. The Apparatus for Thermal
Diffusivity Measurement By the Laser Pulse Method -- 11. Modulated Electron Beam Thermal Diffusivity equipment -- 12. Instruments for Measuring Thermal Conductivity, Thermal Diffusivity, and Specific Heat Under Monotonic Heating -- 13.
Apparatus for Measuring Thermophysical Properties of Liquids By Ac Hot-Wire techniques -- 14. PracticaL Modulation Calorimetry -- 15. Phase-Change Calorimeter for Measuring Relative Enthalpy in the Temperature Range 273.15 to 1200 K --
16. Apparatus for Investigation of Thermodynamic Properties of Metals by Levitation Calorimetry -- 17. A Millisecond-Resolution Pulse Heating System for Specific-Heat Measurements at High Temperatures -- 18. The Application of
Differential Scanning Calorimetry to the Measurement of Specific Heat -- 19. Methods of Measuring Thermal Expansion -- 20. Recent Thermal Expansion Interferometric Measuring Instruments -- 21. Apparatus for Continuous Measurement of
TemperaturE Dependence of Density of Molten Metals By the Method of a Suspended PycnometeR at High Temperatures and Pressures -- 22. Reference Materials for Thermophysical PropertieS
Series:SpringerLink (Online service)
Series:Springer eBooks
Keywords: Physics , Condensed matter , Solid state physics , Crystallography , Spectroscopy , Microscopy , Materials science , Physics , Solid State Physics , Spectroscopy and Microscopy , Condensed Matter Physics , Crystallography , Characterization and Evaluation of Materials
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Call number:SPRINGER-1989-9781461305279:ONLINE Show nearby items on shelf
Title:Evaluation of Advanced Semiconductor Materials by Electron Microscopy
Size:1 online resource (412p p.)
Contents:High Resolution Electron Microscopy -- HREM of Edge-on Interfaces and Defects -- Image Processing Applied to HRTEM Images of Interfaces -- II-VI Semiconductor Interfaces -- High Resolution Electron Microscopy Study of Indium
Distribution in InAs/GaAs Multilayers -- Convergent Beam Electron Diffraction -- Convergent Beam Electron Diffraction Studies of Defects, Strains and Composition Profiles in Semiconductors -- HOLZ Diffraction from Semiconductor
Superlattices -- Determination of Composition and Ionicity by Critical Voltage and Other Electron Diffraction Methods -- Measurement of Structure-Factor Phases by Electron Diffraction for the Study of Bonding in Non-Centrosymmetric
Semiconductors -- X-ray and Electron Energy Loss Microanalysis -- EDX and EELS Studies of Segregation in STEM -- Cathodoluminescence and Electron Beam Induced Conductivity -- TEM-Cathodoluminescence Study of Single and Multiple Quantum
Wells of MBE Grown GaAs/AlGaAs -- EBIC Studies of Individual Defects in Lightly Doped Semiconductors CdTe as an Example -- Schottky Barriers -- Electronic Structure and Fermi Level Pinning Obtained with Spatially Resolved Electron
Energy Loss Scattering -- Epitaxial NiSi2 and CoSi2 Interfaces -- Further Analysis of Interfaces -- The Fresnel Method for the Characterisation of Interfaces -- Strains and Misfit Dislocations at Interfaces --
Ordering/decomposition/analysis of local strains -- TEM and STEM Observations of Composition Variations in III-V Semiconductors -- Transmission Electron Microscopy and Transmission Electron Diffraction Studies of Atomic Ordering in
Group III-V Compound Semiconductor Alloys -- Elastic Relaxation and TEM Image Contrasts in Thin Composition-Modulated Semiconductor Crystals -- Surface Microscopy and Diffraction -- Surface and Thin Film Growth Studied by Reflection
High Energy Electron Diffraction -- Low Energy Electron Microscopy (LEEM) and Photoemission Microscopy (PEEM) of Semiconductor Surfaces -- Transmission Electron Microscopy of In-Situ Deposited Films on Silicon -- Surface Studies by SEM
and STEM -- Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structures -- Defects in Heteroepitaxy -- Dislocation Generation and Elimination in GaAs on Si -- The Microstructure of GaAs/Si Films
Studied as a Function of Heat Treatment -- Electron Microscopy of Gex Sil-x/Si Strained Layer Superlattices -- Defect Structure in Low and High Misfit Systems -- In-Situ Electron Microscope Studies of Misfit Dislocation Introduction
into Gex Sil-x/Si Heterostructures -- Misfit Dislocations in Inx Gal-x As/GaAs Heterostructures near the Critical Thickness -- Summary of Discussion on Instrumental Requirements for the Evaluation of Advanced Semiconductors by Electron
Series:SpringerLink (Online service)
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Series:NATO ASI Series, Series B: Physics: 203
Keywords: Medicine , Biomedicine , Biomedicine general
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Call number:SPRINGER-1987-9783642729706:ONLINE Show nearby items on shelf
Title:Picosecond Electronics and Optoelectronics II Proceedings of the Second OSA-IEEE (LEOS) Incline Village, Nevada, January 14–16, 1987
Size:1 online resource (290 p.)
Contents:I High-Speed Probing Techniques -- A Non-contact Electro-optic Prober for High Speed Integrated Circuits -- Photoconductive Generation of Subpicosecond Electrical Pulses and Their Measurement Applications -- Picosecond Sampling of
GaAs Integrated Circuits -- Electro-optic Sampling of High-Speed, InP-Based Integrated Circuits -- Electro-optic Sampling Analysis of Timing Patterns at Critical Internal Nodes in Gigabit GaAs Multiplexers/Demultiplexers -- A Technique
for Wing Suppressed IR Sampling -- Picosecond Electrical Pulse for VLSI Electronics Characterization -- Ultrafast Optics Applied to Modern Device Research -- An Optically Strobed Sample and Hold Circuit -- Laser Pulsed E-Beam System
for High Speed I.C. Testing -- Photoemissive Testing of High-Speed Electrical Waveforms -- High-Speed Optical Logic Using GaAs -- Comparison of Sampling Oscilloscopes with ?35 ps Transition Durations -- Picosecond Optoelectronic Study
of a Thin Film Transmission Line Structure -- II Transient Transport -- Direct Subpicosecond Measurement of Carrier Mobility of Photoexcited Electrons in GaAs -- Nonstationary Transport in MODFETs and Heterojunction Devices -- Monte
Carlo Investigation of Hot Photoexcited Electron Relaxation in GaAs -- Longitudinally Localized Optical Carrier Injection for Femtosecond Transport Studies -- Femtosecond Nonequilibrium Electronic Heat Transport in Thin Gold Films --
III Ballistic Transport and Resonant Tunneling -- Ballistic Transport and Energy Spectroscopy of Hot Electrons in THETA Devices -- Microwave and Millimeter-Wave Resonant Tunneling Diodes -- Quantum Transport Calculation of
Resonant-Tunneling Response Time( -- Resonant Tunneling Electron Spectroscopy -- Analysis of Transit Time Effects due to Spacer Layers in Quantum Well Oscillators -- IV Quantum Wells -- High-Speed Phenomena in GaAs
Multiple-Quantum-Well Structures -- Picosecond Carrier Transport in GaAs Quantum Wells -- Quantum-Confined Stark Effect in InGaAs/InP Quantum Wells Grown by Metal-Organic Chemical Vapor Deposition -- Dynamics of Below-Gap
Photoexcitation in GaAs Quantum Wells -- Optical Reading of InGaAs Modulation Doped Field Effect Transistor -- V High-Speed Electronic Devices -- Molecular Beam Epitaxy (MBE) for High-Speed Devices -- Multigigahertz Logic Based on InP
MISFETs Exhibiting Extremely High Transconductance -- Millimeter-Wave Integrated Circuits -- Enhanced Performance Ultrabroadband Distributed Amplifiers -- High-Performance Quarter-Micron-Gate MODFET -- Progress and Challenges in HEMT
LSI Technology -- Picosecond Switching in Josephson Tunnel Junctions -- Modulation Efficiency Limited High Frequency Performance of the MODFET -- Development of 18 GHz GaAs Static Frequency Dividers and Their Evaluation by Electrooptic
Sampling -- Characteristics of Shielded Microstrip Lines on GaAs-Si at Millimeter-Wave Frequencies -- VI Fast Lasers and Detectors -- Characteristics, Packaging and Physics of Ultra High Speed Diode Lasers and Detectors -- Energy
Variations in Optical Pulses from Gain-Switched AlGaAs Diode Lasers -- Frequency Chirping in Pulse Modulated Gain and Index Guided Single Quantum Well Lasers -- InP/GaInAs/InP PIN Photodiode with FWHM of Photoconductive Picosecond
Microstripline Switches on Self-Implanted Silicon on Sapphire (SOS) -- Picosecond Optoelectronic Switches Using Composite Electronic Materials -- High Speed, High Repetition Rate, High Voltage Photoconductive Switching -- Generation
and Forming of Ultrashort High Voltage Pulses -- Silicon Pulse Sharpening Diodes — Switching Kilovolts in Tens of Picoseconds -- Graphite as a Picosecond Laser Activated Opening Switch -- VIII Optical Microwave Techniques -- Radar and
Electronic Warfare Applications of Multigigahertz Optical Components and Systems -- Characteristics and Applications of Wideband Guided-Wave Devices -- A New Optoelectronic CW Microwave Source -- Optical Intensity Modulation to 40 GHz
Using a Waveguide Electrooptic Switch -- Picosecond Response of an Optically Controlled Millimeter Wave Phase Shifter -- Picosecond Optoelectronic Transceivers -- High Speed Opto-isolator for Radar Applications -- Index of Contributors
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Electronics and Photonics: 24
Keywords: Physics , Optics , Optoelectronics , Plasmons (Physics) , Electronics , Microelectronics , Physics , Optics, Optoelectronics, Plasmonics and Optical Devices , Electronics and Microelectronics, Instrumentation
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Call number:SPRINGER-1986-9783642827273:ONLINE Show nearby items on shelf
Title:Chemistry and Physics of Solid Surfaces VI
Size:1 online resource (667 p.)
Contents:1. Georg-Maria Schwab: Early Endeavours in the Science of Catalysis -- References -- 2. The Life and Times of Paul H. Emmett -- 3. Three Decades of Catalysis by Metals -- 3.1 Bifunctional Catalysis -- 3.2 Characterization of Dispersed
Metals -- 3.2.1 Chemisorption Isotherms -- 3.2.2 Application of Extended X-Ray Absorption Fine Structure -- 3.2.3 Application of Nuclear Magnetic Resonance -- 3.3 Hydrocarbon Reactions on Metals -- 3.3.1 Hydrogenolysis -- 3.3.2
Hydrogenation and Dehydrogenation -- 3.3.3 Isomerization -- 3.4 Bimetallic Catalysts -- 3.4.1 Metal Alloys as Catalysts -- 3.4.2 Bimetallic Aggregates of Immiscible Components -- 3.4.3 Bimetallic Clusters -- 3.5 Summary -- References
-- 4. Molecular Organometallic Chemistry and Catalysis on Metal-Oxide Surfaces -- 4.1 Synthesis -- 4.2 Structure Determination by Physical Methods -- 4.2.1 Infrared Spectroscopy -- 4.2.2 Laser Raman Spectroscopy -- 4.2.3 Inelastic
Electron Tunneling Spectroscopy -- 4.2.4 Extended X-Ray Absorption Fine Structure Spectroscopy -- 4.2.5 Ultraviolet-Visible Reflectance Spectroscopy -- 4.2.6 Nuclear Magnetic Resonance (NMR) -- 4.2.7 Temperature-Programmed
Decomposition -- 4.2.8 High-Resolution Transmission Electron Microscopy -- 4.2.9 Other Methods and General Points -- 4.3 Reactivity -- 4.4 Catalytic Activity -- 4.5 Supported Metals with Simple Structures Derived from Supported
Organometallics -- 4.6 Summary -- References -- 5. Catalysis by Molybdena-Alumina and Related Oxide Systems -- 5.1 Nature of the Catalyst -- 5.2 Nature of the Catalytic Centers -- 5.3 The Chemisorption of Hydrogen on the Catalytic
Centers -- 5.4 Relationships with Catalysis -- References -- 6. Structure and Catalytic Performance of Zeolites -- 6.1 Introduction to Zeolites -- 6.2 Some Structural Considerations -- 6.3 Fundamentals of Catalysis by Zeolites: A
Resumè -- 6.4 Converting a Zeolite to Its Catalytically Active Form -- 6.5 Influence of Intergrowths on Catalytic Performance -- 6.6 Siting and Energetics of Guest Species Inside Zeolite Catalysts -- 6.7 Evaluating Currently Unsolved
Zeolitic Structures -- 6.8 Analogy Between Zeolitic and Selective Oxidation Catalysts -- References -- 7. Structural Characterization of Molecules and Reaction Intermediates on Surfaces Using Synchrotron Radiation -- 7.1 Principles of
X-Ray Absorption -- 7.1.1 General Features -- 7.1.2 Surface Extended X-Ray Absorption Fine Structure -- 7.1.3 Near Edge X-Ray Absorption Fine Structure -- 7.1.4 Apparatus -- 7.2 SEXAFS Studies of Polyatomic Adsorbates -- 7.2.1
Structure of Formate on the Cu{100} Surface -- 7.2.2 Structure of Formate on the Cu{110} Surface -- 7.2.3 Structure of Methoxy on the Cu{100} Surface -- 7.3 NEXAFS Studies of Polyatomic Adsorbates -- 7.3.1 Oxidation Intermediates on
Cu{100} and Cu{110} -- 7.3.2 Hydrocarbons on Pt{111} -- 7.3.3 Sulfur-Containing Hydrocarbons on Pt{111} -- 7.4 Conclusions and Outlook -- References -- 8. Effects of Surface Impurities in Chemisorption and Catalysis -- 8.1 Experimental
Details -- 8.2 Discussion -- 8.2.1 Electronegative Impurities -- a) Chemisorption -- b) Catalytic Activity -- c) Catalytic Selectivity -- 8.2.2 Electroneutral Impurities -- a) Copper Overlayer Structure -- b) Chemisorption -- c)
Catalytic Activity -- 8.2.3 Electropositive Impurities -- a) Chemisorption -- b) Carbon Monoxide Dissociation Kinetics -- c) Methanation Kinetics -- d) Promotion of Higher Hydrocarbon Formation -- e) Electronic Compensation Effects --
8.2.4 Related Theory -- 8.3 Conclusions -- References -- 9. Thermodynamics and Kinetics in Weakly Chemisorbed Phases -- 9.1 Evaluation of the Isosteric Heat and Entropy of Adsorption -- 9.2 Correlation Between Thermodynamic and Kinetic
Experiments -- 9.3 Structural and Thermodynamic Data on Weakly Chemisorbed Phases -- 9.3.1 Phase Diagram for N2 Adsorbed on Ni{110} and Data for N2 on Ni {100} -- 9.3.2 The Isosteric Heat of Adsorption and the Entropy in the Adsorbed
Phase for N2/Ni{110} and N2/NHIOO} -- 9.3.3 Carbon Monoxide on Low-Index Copper Single Surfaces -- 9.3.4 Thermodynamic Measurements at Very Small Coverages -- 9.4 Kinetics in Weakly Adsorbed Phases -- 9.4.1 Adsorption and Desorption
Kinetics -- 9.4.2 Chemical Reactions in Weakly Chemisorbed Phases -- 9.5 Summary -- References -- 10. Kinetic and Spectroscopic Investigations of Surface Chemical Processes -- 10.1 Experimental Methods -- 10.2 Kinetic Studies of
Methanol Decomposition on Ni{111} -- 10.2.1 Isothermal Decomposition of Methanol on Clean Ni{111} -- 10.2.2 Steady-State Kinetics of Methanol Decomposition on Ni {111} -- 10.3 Scanning Kinetic Spectroscopy (SKS) Methods for the Study
of the Decomposition of Alcohols on Ni{111} -- 10.3.1 Rationale for the SKS Method -- 10.3.2 Methanol Decomposition on Ni{111} —SKS Measurements -- 10.3.3 Ethanol Decomposition on Ni{111} Using SKS -- 10.4 Summary of Results --
References -- 11. Raman Spectroscopy of Adsorbed Molecules -- 11.1 Unenhanced Raman Spectroscopy of Adsorbed Molecules -- 11.1.1 Surface Electromagnetic Fields -- 11.1.2 Angle-Resolved Surface Raman Scattering -- 11.1.3 Selection Rules
-- 11.1.4 Examples -- 11.2 Surface-Enhanced Raman Spectroscopy -- 11.2.1 Electromagnetic Enhancement -- 11.2.2 Chemical Enhancement -- 11.3 Future Work -- References -- 12. The Time-of-Flight Atom-Probe and Its Application to Surface
Analysis and Gas-Surface Interactions -- 12.1 The Time-of-Flight Atom-Probe -- 12.1.1 Basic Principles -- 12.1.2 Mass Resolution -- 12.1.3 Pulsed High-Voltage Atom-Probes -- 12.1.4 The Pulsed-Laser Time-of-Flight Atom-Probe -- 12.1.5 A
Statistical Method of Counting Single Ions -- 12.1.6 Imaging Atom-Probes -- 12.1.7 A Method for Ion-Reaction-Time Amplification -- 12.2 Structural and Compositional Analysis of Solid Surfaces -- 12.2.1 Atomic Structures of Emitter
Surfaces -- 12.2.2 Compositional Analysis of Surface Atomic Layers: Alloy Segregations and Impurity Segregation -- 12.3 Gas-Surface Interactions -- 12.3.1 Field Adsorption -- 12.3.2 Surface Reactivity in the Formation of H3 -- 12.3.3
Atomic Steps and Reaction Intermediates in Ammonia Synthesis -- 12.4 Ion-Reaction-Time Measurement — Field Dissociation by Atomic Tunneling -- 12.5 Summary -- References -- 13. Field Emission Microscopy—Trends and Perspectives -- 13.1
Historical Background -- 13.2 Some Comments Related to Curved and Planar Surfaces -- 13.3 Field-Electron Emission Microscopy -- 13.3.1 Conceptual -- 13.3.2 The Microscopy -- a) The Microscope -- b) Magnification -- c) Contrast -- d)
Resolution -- e) The Specimen -- f) Criteria for a Clean Surface -- g) Specimen Materials -- 13.3.3 Selected Field-Electron Emission Microscopy Research -- a) Visibility of Atomic and Molecular Objects -- b) Surface Diffusion -- c)
Nucleation and Crystal Growth -- d) Cleaning Platinum Field Emitters -- e) Electron Energy Distributions -- 13.4 Field-Ion Microscopy -- 13.4.1 The Microscopy -- a) The Microscope -- b) The Image -- c) More About Field Evaporation --
d) The Specimen -- 13.4.2 Selected Field-Ion Microscopy Research -- a) Surface Diffusion -- b) Clean-Surface bcc{001} Atomic Structure -- 13.5 Summary and Future Outlook -- References -- 14. Scanning Tunneling Microscopy -- 14.1
Introduction -- 14.2 Experimental Considerations -- 14.3 Tunnel Current and Tunnel Barrier -- 14.3.1 Basic Model Calculations and Approximations -- 14.3.2 Calculations for Nonplanar Tip-Surface Geometries -- 14.3.3 The Effect of the
Image Potential -- 14.3.4 Resolution of the STM -- 14.3.5 Sample Conductivity -- 14.3.6 Effect of Adsorbates -- 14.4 Surface Microscopy -- 14.4.1 Topography of Flat Surfaces -- 14.4.2 Periodic Structures of Single-Crystalline Surfaces
-- 14.4.3 Surface Defects -- 14.4.4 Reactivity and Stability of Surfaces -- 14.4.5 Non-Surface-Science Applications of the STM -- 14.4.6 Surface Diffusion and Surface Mobility -- 14.5 Tunneling Spectroscopy -- 14.5.1 Valence Band
Spectroscopy -- 14.5.2 Resonant Tunneling -- 14.5.3 Scanning Tunneling Spectroscopy -- 14.5.4 The Work Function and Work Function Images -- 14.6 Conclusions -- References -- 15. High-Resolution Electron Microscopy in Surface Science --
15.1 Imaging Methods -- 15.1.1 Transmission Electron Microscopy -- 15.1.2 Reflection Electron Microscopy -- 15.2 Instrumentation and Accessories -- 15.3 Survey of Results -- 15.3.1 Bright-Field Transmission Electron Microscopy --
15.3.2 Dark-Field Transmission Electron Microscopy -- 15.3.3 Reflection Electron Microscopy -- 15.3.4 Profile Imaging -- 15.3.5 Dynamic Processes -- 15.3.6 Image Contrast Calculations -- 15.4 Perspective and Outlook -- 15.5 Further
Reading -- References -- 16. Surface Electronic States -- 16.1 Experimental Techniques -- 16.2 Valence Electronic States: Ideal Surfaces -- 16.3 Valence States: New Developments -- 16.4 Core Levels: Surfaces and Interfaces in
Technology -- References -- 17. The Use of Spin-Polarized Electrons in Surface Analysis -- 17.1 Introduction to Spin-Polarized Electrons -- 17.2 Nonmagnetic Materials -- 17.2.1 Electron Diffraction -- 17.2.2 Application of
Spin-Polarized LEED: Spin-Polarization Detectors -- 17.2.3 Photoemission -- 17.2.4 Application of Spin-Polarized Photoemission: Polarized Electron Sources -- 17.3 Magnetic Materials -- 17.3.1 Elastic Electron Scattering -- 17.3.2
Secondary Electron Emission and Magnetic Structure Analysis -- 17.3.3 Electronic Structure and Stoner Excitations -- 17.4 Conclusion -- References -- 18. Inverse Photoemission Spectroscopy -- 18.1 Historical Overview -- 18.2
Instrumentation -- 18.3 Density of States -- 18.4 Band Structures and Surface States -- 18.5 Adsorbate States -- 18.6 Summary and Outlook -- References -- 19. The Structure of Surfaces -- 19.1 Structure of the GaAs{lll}-(2 x2) Surface
-- 19.1.1 Reconstruction Mechanisms on the GaAsdll} Surface -- 19.1.2 Vacancy-Buckling Model of GaAs{lll}-(2×2) -- 19.2 Structure of the GaAs{110}-(l ×1) Surface -- 19.2.1 Surface Relaxation on the {110} Surface -- 19.2.2 Value of the
? Tilt Angle o
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Series:Springer Series in Surface Sciences: 5
Keywords: Physics , Physical chemistry , Surfaces (Physics) , Interfaces (Physical sciences) , Thin films , Materials , Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films , Physical Chemistry
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Call number:QC320.J213:V2 Show nearby items on shelf
Title:Heat Transfer: Volume 2
Author(s): Max Jakob 1879-1955
Publisher:Wiley: New York
Size:652 pgs.
Note:Part 2 of a 2 volume set
Contents:Part F: Heat Radiation in Spaces of Simple Configuration - 31. Heat Radiation through a Non-Absorbing Medium, 32. Heat Radiaiton through Absorbing Media
Part G. Selected Fields of Applicaiton - 33. Heat Transfer in Thermometry and Related Branches of Measurement, 34. Ordinary Heat Exchangers (Recuperators), 35. Regenerators, 36. Cooling Towers, 37. Cooling by Falling Liquid Films, 38. cooling of Surfaces Exposed to Hot Gases, 39. Heat Transfer through Laminar Boundary Layer at High Fluid Velocity, 40. Heat Transfer Through Turbulent Boundary Layer at High Flluid Velocity, 41. Heat Transfer in Liquid Metals, 42. Steady-State Heat Transfer in Packed Columns
Keywords: Heat Transmission
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