Fermilab Fermilab Core Computing Division

Library Home |  Ask a Librarian library@fnal.gov |  Book Catalog |  Library Journals |  Requests |  SPIRES |  Fermilab Documents |

Fermilab Library
SPIRES-BOOKS: FIND KEYWORD SECONDARY ION MASS SPECTROMETRY *END*INIT* use /tmp/qspiwww.webspi1/8675.112 QRY 131.225.70.96 . find keyword secondary ion mass spectrometry ( in books using www Cover
Image
Call number:9781606505885:ONLINE Show nearby items on shelf
Title:Secondary Ion Mass Spectrometry : Applications for Depth Profiling and Surface Characterization
Author(s): F. A. Stevie
Date:2016
Publisher:Momentum Press
ISBN:9781606505892
Keywords: Technology & Engineering , Materials Science
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1996-9783709165553:ONLINE Show nearby items on shelf
Title:Microbeam and Nanobeam Analysis
Author(s):
Date:1996
Size:1 online resource (4 p.)
Note:10.1007/978-3-7091-6555-3
Contents:Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis -- Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications -- Use of Soft X-Rays in Microanalysis -- Intensity Measurement of
Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region -- Synchrotron Radiation Induced X-ray Microfluorescence Analysis -- Particle-Induced X-Ray Emission — A Quantitative Technique Suitable for
Microanalysis -- Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materials -- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) -- Three-Dimensional Nanoanalysis with the
Tomographic Atom-Probe -- Microanalysis at Atomic Resolution -- Composition of Vanadium Carbides Formed by Solidification in Fe-V-C-M Alloys: Influence of Additions (M = Al, Cu, Mo) -- Electron Transmission Coefficient for Oblique
Angle of Incidence -- Depth Distribution Function for Oblique Angle of Incidence -- Simulation of EDS Spectra Using X-RES Software -- On the Use of the GeL? Line in Thin Film X-Ray Microanalysis of Si1-x Gex/Si Heterostructures --
Computer Simulations of the X-Ray Intensity Distribution from Submicron Particles Embedded in a Matrix -- Determination of Rare Earth Elements in Biological and Mineral Apatite by EPMA and LAMP-ICP-MS -- Quantitative Analysis of the
Compound Layer of Plasma Nitrided Pure Iron -- Correction of the Edge Effect in Auger Electron Microscopy -- Low Energy Imaging of Nonconductive Surfaces in SEM -- Investigation of the Bonding Mechanism of Glass Ceramic Layers on Metal
Alloys -- Monte Carlo Method for Quantitative Analysis of Bulk and Layered Samples -- SIMS Linescan Profiling of Chemically Bevelled Semiconductors: a Method of Overcoming Ion Beam Induced Segregation in Depth Profiling -- Experimental
Verification of Theoretical Models Simulating the Temperature Increase in EPMA of Glass -- Quantitation of Mineral Elements of Different Fruit Pollen Grains -- Electron Beam Induced Migration of Alkaline Ions in Silica Glass --
Application of the Boltzmann Transport Equation in the Thickness Determination of Thin Films -- Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images -- Calculation of
the Surface Ionisation Using Analytical Models of Electron Backscattering -- Thickness Determination of Thin Insulating Layers -- High Energy and Angular Resolution Dynamic Secondary Ion Mass Spectrometry -- EPMA and Mass Spectrometry
of Soil and Grass Containing Radioactivity from the Nuclear Accident at Chernobyl -- Application of a New Monte Carlo Simulation Algorithm to Electron Probe Microanalysis -- Topography Development on Single Crystal MgO Under Ion Beam
Bombardment -- Determination of SPM TIP Shape Using Polystyrene Latex Balls -- Combined Characterization of Nanostructures by AEM and STM -- Study of Quasi-Fractal Many-Particle-Systems and Percolation Networks by Zero-Loss
Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Digital Image Analysis -- Calculation of Bremsstrahlung Spectra for Multilayer Samples -- Thickness Measurement of Thin Films by EPMA — Influence of ? (0), MAC’s and
Substrate -- A Simple Procedure to Check the Spectral Response of an EDX Detector -- Virtual WDS -- Monte Carlo Simulation Program with a Free Configuration of Specimen and Detector Geometries -- Barriers to Energy Dispersive
Spectrometry with Low Energy X-Rays -- Measurements of Ga1-xAlxAs Layers on GaAs with EDS -- The Relative Intensity Factor for La Radiation Considering the Different Mass Absorption of La and L? Radiation -- Determination of the
Solubility of Cerium in BaTiO3 by Quantitative WDS Electron Probe Microanalysis -- Simulation of X-Ray Diffraction Profiles of Gradually Relaxed Epilayers -- Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures
Using a Modified Quadtree Geometry Discretization -- Chemical-Bond Characterization of Nanostructures by EELS -- Local Determination of Carbon by Combining Beta-Autoradiography and Electron Microprobe Analysis -- The Check of the
Elastic Scattering Model in Monte-Carlo Simulation -- True Colour X-Ray Vision for Electron Microscopy and Microanalysis -- Determination of the Oxidation States of Nb by Auger Electron Spectroscopy -- Study by SIMS of the 54Cr and 18O
Diffusion in Cr2 O3 and in Cr2O3 Scales -- Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings -- Electron Probe X-Ray Microanalysis of
Coatings -- Analysis of Layers: X-Ray Maps of Change in Thickness Obtained by Electron Macroprobe -- Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Siin Absolute Units -- Practical Aspects and Applications
of EPMA at Low Electron Energies -- Oxidation and Reduction Processes of Be/BeO Induced by Electrons
ISBN:9783709165553
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta Supplement: 13
Keywords: Chemistry , Analytical chemistry , Physical chemistry , Solid state physics , Optics , Optoelectronics , Plasmons (Physics) , Spectroscopy , Microscopy , Materials , Thin films , Chemistry , Analytical Chemistry , Physical Chemistry , Solid State Physics , Spectroscopy and Microscopy , Optics, Optoelectronics, Plasmonics and Optical Devices , Surfaces and Interfaces, Thin Films
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1992-9783709166796:ONLINE Show nearby items on shelf
Title:Electron Microbeam Analysis
Author(s):
Date:1992
Size:1 online resource (278 p.)
Note:10.1007/978-3-7091-6679-6
Contents:EPMA - A Versatile Technique for the Characterization of Thin Films and Layered Structures. -- Quantitative EPMA of the Ultra-Light Elements Boron Through Oxygen. -- Auger Microscopy and Electron Probe Microanalysis. -- Quantitative
X-Ray Microanalysis of Ultra-Thin Resin-Embedded Biological Samples. -- Analytical and High-Resolution Electron Microscopy Studies at Metal/Ceramic Interfaces. -- Quantitative Electron Probe Microanalysis of Multi-layer Structures. --
Comparison of ? (?z) Curve Models in EPMA. -- Quantitative Electron Probe Microanalysis: New Accurate ? (?z) Description. -- A Modular Universal Correction Procedure for Quantitative EPMA. -- Monte Carlo Simulation of Backscattered and
Secondary Electron Profiles. -- An Electron Scattering Model Applied to the Determination of Film Thicknesses Using Electron Probe Microanalysis. -- Calculation of Depth Distribution Functions for Characteristic and for Continuous
Radiation. -- A Method for In-Situ Calibration of Semiconductor Detectors. -- Background Anomalies in Electron Probe Microanalysis Caused by Total Reflection. -- Automatic Analysis of Soft X-Ray Emission Spectra Obtained by EPMA. --
The Scanning Very-Low-Energy Electron Microscopy (SVLEEM). -- To the Backscattering Contrast in Scanning Auger Microscopy. -- Design Consideration Regarding the Use of an Accelerator on Mass Spectrometer in Ion Microanalysis. --
Accurate Estimation of Uncertainties in Quantitative Electron Energy- Loss Spectrometry. -- An EELS System for a TEM/STEM-Performance and Its Use in Materials Science. -- Quantitative X-Ray Microanalysis of Bio-Organic Bulk Specimens.
-- Quantitative Analysis of (Y2O3)x (ZrO2)1-x Films on Silicon by EPMA. -- EPMA of Surface Oxide Films. -- Non-Destructive Determination of Ion-Implanted Impurity Distribution in Silicon by EPMA. -- An Electron Spectroscopy Study of
a-SiNx Films. -- Electron Probe Microanalysis of Glass Fiber Optics. -- Quantitative Microanalysis of Low Concentrations of Carbon In Steels. -- Electron Configuration of the Valence-Conduction Band of the Mineral Wustite. --
Structural Analysis of Silver Halide Cubic Microcrystals with Epitaxial or Conversion Growths by STEM-EDX. -- Characterization of the Bony Matrix of the Otic Capsule in Human Fetuses by EPMA. -- Overview
ISBN:9783709166796
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta: 12
Keywords: Chemistry , Analytical chemistry , Physical chemistry , Polymers , Chemistry , Analytical Chemistry , Polymer Sciences , Physical Chemistry
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1992-9783662027677:ONLINE Show nearby items on shelf
Title:Surface Analysis Methods in Materials Science
Author(s):
Date:1992
Size:1 online resource (453 p.)
Note:10.1007/978-3-662-02767-7
Contents:1. Solid Surfaces, Their Structure and Composition -- 2. UHV Basics -- 3. Electron Microscope Techniques for Surface Characterization -- 4. Sputter Depth Profiling -- 5. SIMS — Secondary Ion Mass Spectrometry -- 6. Auger Spectroscopy
and Scanning Auger Microscopy -- 7. X-Ray Photoelectron Spectroscopy -- 8. Fourier Transform Infrared Specroscopy of Surfaces -- 9. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis -- 10. Scanning Tunnelling
Microscopy -- 11. Low Energy Ion Scattering -- 12. Reflection High Energy Electron Diffraction -- 13. Low Energy Electron Diffraction -- 14. Ultraviolet Photoelectron Spectroscopy of Solids -- 15. Spin Polarized Electron Techniques --
16. Materials Technology -- 17. Characterization of Catalysts by Surface Analysis -- 18. Applications to Devices and Device Materials -- 19. Characterization of Oxidized Surfaces -- 20. Coated Steel -- 21. Thin Film Analysis -- 22.
Identification of Adsorbed Species -- IV Appendix -- Acronyms Used in Surface and Thin Film Analysis -- Surface Science Bibliography
ISBN:9783662027677
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Surface Sciences: 23
Keywords: Physics , Surfaces (Physics) , Interfaces (Physical sciences) , Thin films , Materials , Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1991-9781468479263:ONLINE Show nearby items on shelf
Title:Methods and Mechanisms for Producing Ions from Large Molecules
Author(s):
Date:1991
Size:1 online resource (344 p.)
Note:10.1007/978-1-4684-7926-3
Contents:The Founding Fathers of Mass Spectroscopy -- MeV Particle Bombardment -- Plasma Desorption Mass Spectrometry — Achievements and Frontiers -- A New Concept: The Fast Preequilibrium Charge State of Swift Ions in Solids -- PDMS With
Volatile Organic Compounds -- Competitive Peptide Adsorption to Nitrocellulose Covered Backing Material in Cf-252-Plasma Desorption Mass Spectrometry -- Charting of Rat Pituitary Peptides by Plasma Desorption and Electrospray
Ionization Mass Spectrometry -- Energy and Angular Distributions of Secondary Ions Ejected from Clean Metals by MeV Ion Impact -- Different Mechanisms of Negative Ion Formation Observed with Chlorophyll-a -- Sequence Informative
Fragmentation in 252Cf Plasma Desorption Mass Spectrometry -- MeV Bombardment: Theory -- Ion Formation in Electronic Sputtering from Decane -- Spatial Distribution of Biomolecules Sputtered Under Fast Heavy Ion Bombardment -- Heavy-Ion
and Laser-Pulse-Induced Ejection of Large Organic Molecules -- keV Particle Bombardment -- Experimental Observations of Particle Emission from Liquid Organic Matrices Bombarded by keV Ions -- Evaluation of Secondary Ion Internal Energy
Distribution in LSIMS -- Cluster Ion Emission From Cesium Chloride Bombarded with Atomic and Molecular Ions -- Negative Secondary Ion Mass Spectrometry of Gold Surfaces -- Sequencing an Unknown Peptide -- Sensitivity Measurements for
Parent and Daughter Ions of Peptides in a Reflecting Time-of-Flight Mass Spectrometer -- keV Bombardment: Theory -- Stopping and Scattering of Slow Cluster Ions -- Molecular Dynamics Simulation of Bulk Desorption -- Spray Ionization
Methods -- On the Mechanisms Involved in Spray Ionization -- Electrospray, Mechanism and Performance -- Optical Studies of Electrohydrodynamic Disintegration of Liquids in EH and ES Mass Spectrometry -- Electrohydrodynamic Mass
Spectrometry: How High Can It Go? -- Electrospray Ionization Mass Spectrometric Analysis of Proteins -- Laser Desorption -- Laser Desorption Mass Spectrometry — Some Technical and Mechanistic Aspects -- Matrix — Assisted UV Laser
Desorption with a Time Digitizer -- Investigations of Matrix Isolated, (UV) Laser Induced Polymer Sublimation Using a Time-of-Flight Mass Spectrometer -- On the Detectability of Low Velocity High Mass Ions in Matrix Assisted Laser
Desorption TOF-MS -- Matrix-Assisted Laser Desorption Fourier Transform Mass Spectrometry for Biological Compounds -- Laser Induced Desorption of Atoms from Metal Particles: Mechanism and Applications -- Laser Desorption: Theory -- On
the Mechanism of Volatilization of Large Biomolecules by Pulsed Laser Ablation of Frozen Aqueous Solutions -- Laser Desorption of Large Molecules: Mechanisms and Models -- Macromolecule Desorption from the Film Back Side Under Laser
Irradiation -- Post — Ionization of Desorbed Neutrals -- Post-Ionization of Laser-Desorbed Organics by Single-Photon Ionization -- Laser-Induced Resonance Enhanced Multiphoton Ionization in Supersonic Beams -- Laser
Desorption/Photoionization Time-of-Flight Mass Spectrometry of Polymer Additives -- Laser Desorption and Laser Post-Ionization Time-of-Flight Mass Spectrometry -- Participants
ISBN:9781468479263
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:NATO ASI Series, Series B: Physics: 269
Keywords: Physics , Nuclear physics , Heavy ions , Hadrons , Physics , Nuclear Physics, Heavy Ions, Hadrons
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1991-9781468459647:ONLINE Show nearby items on shelf
Title:Fundamental Aspects of Heterogeneous Catalysis Studied by Particle Beams
Author(s):
Date:1991
Size:1 online resource (472 p.)
Note:10.1007/978-1-4684-5964-7
Contents:General Catalysis -- to the Use of Particle Beam Techniques in Heterogeneous Catalysis -- Heterogeneous Catalysts and Catalytic Processes -- Production of Industrial Catalysts -- Importance of Surface Chemistry/Catalysis in the
Processing of Semiconductors -- Irreversible Adsorption of Metal Atoms in Electrocatalysis -- Electrocatalysis on Well-Defined Platinum Surfaces -- Effect of Surface-Catalyzed NO Formation on Thermal Load in Hypersonics --
Electrochemical Probing of Step and Terrace Sites on Pt[n(11?1)×(111)] and Pt[n(111)×(100)] -- Reactivity -- Quantum Chemistry of Surface Chemical Reactivity -- Ion Scattering as a Tool for a Better Understanding of Chemical Reactions
on Surfaces -- Oscillating Structural Changes in Catalytic Reactions -- Molecular Dynamics for Reactions of Heterogeneous Catalysis -- Is There a Distribution of Transition State Energies in the Reaction Coordinate of CO Oxidation on
Pt Foil? -- Catalyst Characterization -- Nuclear Magnetic Resonance -- Nuclear Magnetic Resonance Spectroscopy in Studies of Catalysts -- Photons -- Characterization of Heterogeneous Catalysts by Vibrational Spectroscopies --
Applications of X-Ray Absorption Spectroscopy in Catalysis -- A Model for Characterising the Growth of Ruthenium on Amorphous Alumina by the Use of the Auger Parameter -- In Situ FTIR Spectroscopy of Cu-Cr Catalysts in CO Oxidation --
Depth Profiling of Rh/CeO2 Catalysts: an Alternative Method for Dispersion Analysis -- Electrons -- Electron Stimulated Desorption and Other Methods for the Study of Surface Phenomena Related to Atomic Level Aspects of Heterogeneous
Catalysis -- HREELS and TDS Studies of NO + H2 and NH3 + O2 Reactions on Pt(111) -- Neutrons -- Use of Neutron Beams in Studying Vibrational Modes of Molecules Adsorbed on Catalysts -- Ions -- Low-Energy Ion Scattering Investigations
of Catalysts I -- Low-Energy Ion Scattering Investigations of Catalysts II -- Time-of-Flight Scattering and Recoiling Spectrometry (TOF-SARS) for Surface Structure Determinations -- High-E Ion Scattering and Atom Location -- Secondary
Ion Mass Spectrometry — Fundamentals and Application to Heterogeneous Catalysis -- Study of the Pt3Sn(100), (111) and (110) Single Crystal Surfaces by LEIS and LEED -- Study of the Surface Structure of V2O5/?-Al2O3 Catalysts by LEIS --
Growth of Palladium on Zinc Oxide Surfaces -- Ion Scattering Analysis of Rh Adlayers on Alumina Films -- Energy-Dependent Effects in Low Energy Ion Scattering from TiO2, Ti and H2O Ice -- Factors Which Affect Peak Shapes and Areas in
Ion Scattering Spectroscopy -- The Measurement of Absolute Surface Coverages Using Nuclear Reaction Analysis -- On the Neutralization Models in LEIS -- Deuterium-Oxygen Reaction on Pt(111): Catalysis by Defects -- Directors and
Lecturers
ISBN:9781468459647
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:NATO ASI Series, Series B: Physics: 265
Keywords: Chemistry , Analytical chemistry , Physical chemistry , Atoms , Physics , Chemistry , Analytical Chemistry , Physical Chemistry , Atomic, Molecular, Optical and Plasma Physics
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1989-9783642934131:ONLINE Show nearby items on shelf
Title:Polycrystalline Semiconductors Grain Boundaries and Interfaces
Author(s):
Date:1989
Size:1 online resource (3 p.)
Note:10.1007/978-3-642-93413-1
Contents:I Grain Boundary Structure -- Intergranular Total Energy Maps and the Structure of a Grain Boundary -- Grain Boundary Structure Determination by HREM: A Comparison with Computer Relaxed Configurations for Pure Tilt in Germanium --
Multiple Structures of a [001] ? = 13 Tilt Grain Boundary in Germanium -- Computer Modelling of Grain Boundaries by Use of Interatomic Potentials -- Transmission of Dislocations with Non-common Burgers Vectors Through ? = 9 (12?2)
Boundaries in Silicon and Germanium Observed by In Situ HVEM -- II Grain Boundary Chemistry and Electronic Properties -- High Resolution Electron Microscopy of the Structure and Chemistry of Grain Boundaries and Other Interfaces in
Semiconductors -- Theoretical Studies of the Impurity Segregation and Electrical Properties of Polycrystalline Silicon by LCAO Electronic Theory -- Electronic Properties of ? = 25 Silicon Bicrystals by Deep Level Transient Spectroscopy
-- The Influence of Structure and Impurity Precipitation on the Electrical Properties of the Grain Boundaries in Silicon: Copper Precipitation in the ? = 25 Boundary -- EBIC Contrast and Precipitation in ? = 13 and ? = 25 Annealed
Silicon Bicrystals -- Electron Beam Induced Current Contrast and Transmission Electron Microscopy Analysis of Special Grain Boundaries in Silicon -- SEM-EBIC Investigations of the Electrical Activity of Grain Boundaries in Germanium --
III Segregation, Activation and Passivation -- Atomic-Level Imaging and Microanalysis of Grain Boundaries in Polycrystalline Semiconductors -- Investigation of the Cobalt Segregation at Grain Boundaries in Silicon -- On the Influence
of the Cottrell Atmosphere on the Recombination Losses at Grain Boundaries in Polycrystalline Silicon -- Hydrogen Passivation of Grain Boundaries in Silicon Sheet Material -- Atomic Hydrogen Passivation Studies of Microcrystalline
Phases in Ion-Implant Damaged Surface Layers of Silicon -- Hydrogen Injection and Migration in Silicon -- Analysis of the Polycrystalline Semiconducting Film Electrical Resistance Variation Due to Isothermal Desorption and Temperature
Stimulated Desorption of Oxygen -- IV Segregation, Activation and Passivation -- Activation and Passivation of Grain Boundary Recombination Activity in Polycrystalline Silicon -- Thermal Activation and Hydrogen Passivation of Grain
Boundaries -- Analysis of Metal-Doped Polycrystalline Silicon with Secondary Ion Mass Spectrometry -- Oxygen Detection in Polycrystalline Silicon -- Generation of Radiation Defects in the Vicinity of Twin Boundaries in EFG Silicon
Ribbons -- Physical Properties of Polycrystalline S-Web Si Ribbons -- Grain Boundary Structure in S-WEB Silicon Ribbon -- Characterization of MBE-Grown Polysilicon -- V Technology -- Mechanisms of Epitaxial Growth of Polar
Semiconductors on (001) Silicon -- Preparation and Characterization of Nickel Silicide -- Characterization of the Interface of Silicon pn-Junctions, Fabricated by the Silicon Direct Bonding (SDB) Method -- Metal and Polycrystalline
Silicon Reactions -- Interfacial Reactions of TiNx/Si Contacts -- Linear and Parabolic Growth Kinetics in Binary Couples -- VI Thin Films -- Polycrystalline Compound Semiconductor Thin Films in Solar Cells -- Electronic Properties of
Photoetched CdSe Films -- Thin Film Transistors and Light Sensors with Polycrystalline CdSe-Semiconductors -- VII Crystallization -- Crystallization Processes and Structures of Semiconductor Films -- Crystallized Silicon Films for
Active Devices -- Laser Recrystallization of Polysilicon for Improved Device Quality -- Growth of Sb-Doped Epitaxial Si Layers Through Recrystallization of Poly-Si on a (100) Si Substrate -- VIII Transport Properties -- Current Control
by Electrically Active Grain Boundaries -- Numerical Modelling of the Intergranular Potential Barrier Height and Carrier Concentration in Polysilicon -- Hall Mobility and Carrier Concentration of e-Gun Evaporated Poly-Si Films --
Measurement and Calculation of the Carrier Concentration in Polycrystalline Germanium Thin Films -- Grain Boundary States in Float-Zone Silicon Bicrystals -- Pressure Studies of Metastable Electron Traps in Grain Boundaries of p-HgMnTe
and p-HgCdMnTe -- Band Tailing in Polycrystalline and Disordered Silicon -- IX Thin Films -- Microstructure and Interfaces of Polysilicon in Integrated Circuits -- Effect of the Grain Boundaries in Small Grain Polysilicon Thin Film
Transistors -- Kink Effect in the Double-Gate Accumulation-Mode N-Channel Polysilicon Thin-Film Transistors -- Applications of Poly-Si in Selective-Area and Three-Dimensional Devices -- Thin-Film Transistors from Evaporated Low
Temperature Processed Poly-Si Films -- Pressure Effect on In Situ Boron-Doped LPCVD Silicon Films -- Index of Contributors
ISBN:9783642934131
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Proceedings in Physics: 35
Keywords: Engineering , Physical chemistry , Electronics , Microelectronics , Materials , Thin films , Engineering , Electronics and Microelectronics, Instrumentation , Physical Chemistry , Surfaces and Interfaces, Thin Films
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1986-9783642827181:ONLINE Show nearby items on shelf
Title:Ion Formation from Organic Solids (IFOS III) Mass Spectrometry of Involatile Material
Author(s):
Date:1986
Size:1 online resource (222 p.)
Note:10.1007/978-3-642-82718-1
Contents:I 252Cf-Plasma Desorption -- Use of Polymer Surfaces for Molecular Ion Adsorption and Desorption -- Electronic Sputtering of Biomolecules -- On the Charge-State Dependence of Secondary Ion Emission from Phenylalanine -- Particle
Desorption from Non-Metallic Surfaces by High Energy Heavy Ions -- 252Cf-PDMS: Multiplicity of Desorbed Ions and Correlation Effects -- II Secondary Ion Mass Spectrometry (SIMS) -- Surface Organic Reactions Induced by Ion Bombardment
-- Ion Bombardment MS: A Sensitive Probe of Chemical Reactions Occurring at the Surface of Organic Solids -- Ion-Neutral Correlations Following Metastable Decay -- Metastable Ion Studies with a 252Cf Time-of-Flight Mass Spectrometer --
Increasing Secondary Ion Yields: Derivatization/SIMS -- Aspects and Applications of Derivatization/SIMS -- Influence of the Target Preparation on the SI-Emission of Organic Molecules -- Secondary Ion Formation Processes in Amino
Acid-Metal Adsorption Systems -- Analytical Applications of High-Performance TOF-SIMS -- TOF-SIMS of Polymers in the High Mass Range -- The Application of Time-of-Flight Secondary Ion Mass Spectrometry in the Characterization of
Apolipoprotein Mutants -- III Liquid SIMS Including FAB -- Sputtering Yields from Liquid Organic Matrices -- Sputtering from Liquid and Solid Organic Matrices -- Secondary Ion Emission from Glycerol and Silver Supported Organic
Molecules -- Temperature Effects in Particle Bombardment Mass Spectrometry of Methanol -- Internal Energy Distribution of Ions Emitted in Secondary Ion Mass Spectrometry -- Fast Atom Bombardment of Peptides Above 5000 Daltons -- Amino
Acid Sequencing of Peptide Mixture: Structural Analysis of Human Hemoglobin Variants (Digit Printing Method) -- Oligonucleotide Sputtering from Liquid Matrices -- Some Experiments on the Production of Ions in Soft Ionisation Mass
Spectrometry -- Decompositions Occurring Remote from the Charge Site: A New Class of Fragmentation of FAB-Desorbed Ions -- IV Laser-Induced Ion Formation -- Laser and Plasma Desorption: Matrices and Metastables in Time-of-Flight Mass
Spectrometry -- Evidence for Simultaneous Generation of Ion Pairs in Laser Mass Spectrometry -- The Influence of the Substrate on Ultraviolet Laser Desorption Mass Spectrometry of Biomolecules -- On Different Desorption Modes in LDMS
-- V Other Ion Formation Processes -- “Spontaneous” Desorption of Negative Ions from Organic Solids and Films of Ice at Low Temperature -- Electric Pulse-Induced Desorption Compared to Other Techniques — Mechanism, Mass Spectra, and
Applications -- VI Instrumentation -- A New Dual-MS Technique Combining Negative Ion Formation by Plasma Desorption with EI-like Positive Ion Formation by In-Beam Desorption -- The Chemical Ionization/Particle-Induced Ion Source --
Design of Modern Time-of-Flight Mass Spectrometers -- Design of an Organic SIMS Instrument with Separate Triple Stage Quadrupole (TSQ) and Time-of-Flight (TOF) Spectrometers -- High-Resolution TOF Secondary Ion Mass Spectrometer -- VII
Fourier Transform Ion Cyclotron Resonance -- Laser Desorption Fourier Transform Mass Spectrometry: Mechanisms of Desorption and Analytical Applications -- Desorption Ionization and Fourier Transform Mass Spectrometry for the Analysis
of Large Biomolecules -- Application of Secondary Ion Mass Spectrometry Combined with Fourier Transform Ion Cyclotron Resonance -- Index of Contributors
ISBN:9783642827181
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Proceedings in Physics: 9
Keywords: Chemistry , Physical chemistry , Chemistry , Physical Chemistry
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1985-9783709188408:ONLINE Show nearby items on shelf
Title:Progress in Materials Analysis Vol. 2
Author(s):
Date:1985
Size:1 online resource (382 p.)
Note:10.1007/978-3-7091-8840-8
Contents:Surface Characterization of Thin Organic Films on Metals -- Analysis of Very Thin Organic Fibres by Means of Small Spots Electron Spectroscopy for Chemical Analysis -- Ion Implantation in the Surface Analysis of Solid Materials --
Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations -- Microfocussed Ion Beams for Surface Analysis and Depth Profiling -- Secondary Neutral Mass Spectrometry Depth Profile
Analysis of Silicides -- Analysis of Thin Chromate Layers on Aluminium. I. Opportunities and Limitations of Surface Analytical Methods -- Analysis of Thin Chromate Layers on Aluminium. II. Structure and Composition of No-rinse
Conversion Layers -- Surface Analytical Investigation of the Corrosion Behaviour of Ti(Pd) Samples -- Determination of the Lubricant Thickness Distribution on Magnetic Disks by Means of X-Ray Induced Volatilization and Simultaneous
Photoelectron Spectroscopy -- Internal Quantification of Glow Discharge Optical Spectroscopy-Depth Profiles of Oxide and Nitride Layers on Metals -- Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses --
Neutral Primary Beam Secondary Ion Mass Spectrometry Analysis of Corrosion Phenomena on Glass Surfaces -- Quantitative Distribution Analysis of Phosphorus in Silicon with Secondary Ion Mass Spectrometry -- Positron Studies of Defects
in Metals and Semiconductor -- Kossel Technique and Positron Annihilation Used to Clarify Sintering Processes -- Selection and Qualification Tests of High Temperature Materials by Special Microanalytical Methods -- On the Application
of Acoustic Emission Analysis to Evaluate the Integrity of Protective Coatings t on High-Temperature Alloys -- Microprobe Measurements to Determine the Melt Equilibria of High-Alloy Nickel Materials -- Experimental Determination of the
Depth Distribution of X-Ray Production ?(?z) for X-Ray Energies Below 1 keV -- Electron Probe Microanalysis of Oxygen and Determination of Oxide Film Thickness Using Gaussian ?(?z) Curves -- Procedures to Optimize the Measuring Methods
in the Electron Probe Microanalysis of Low Energy X-Rays -- Quantitative Microstructural Analysis of Sintered Silicon Nitride by Using a Thin-Window Energy Dispersive X-Ray Detector System -- Optimizing the Microstructure of Implant
Alloy TiA15Fe2.5 by Microprobe Analysis -- Characterization of Technical Surfaces With a Coupled SEM-EDA-Image Analyzer System -- Microanalytical Characterization of a Powder Metallurgical Ledeburitic Tool Steel by Transmission
Electron Microscopy -- Determination of the Bonding Behaviour of Carbon and Nitrogen in Micro-Alloyed Structural Steels -- Analytical Electron Microscopy of Rare-Earth Permanent Magnet Materials
ISBN:9783709188408
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta Supplementum, Proceedings of the 12th Colloquium on Materials Analysis, Institute for Analytical Chemistry, Technical University in Vienna, May 13–15, 1985: 11
Keywords: Chemistry , Analytical chemistry , Chemistry , Analytical Chemistry
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1983-9783709139431:ONLINE Show nearby items on shelf
Title:Progress in Materials Analysis Vol. 1
Author(s):
Date:1983
Size:1 online resource (349 p.)
Note:10.1007/978-3-7091-3943-1
Contents:Materials for the First Wall of Fusion Reactors and Their Analytical Characterization -- Application of Positron Annihilation to Metallic Alloys -- Applications of SIMS in Interdisciplinary Materials Characterization -- Quantitative
Secondary Neutral Mass Spectrometry Analysis of Alloys and Oxide-Metal-Interfaces -- Surface Analysis of Metals with SIMS -- Characterization of Metallic Glasses by Ion and Electron Microprobes -- Quantitative Surface Analysis of
CVD-Hard Material Coatings with SIMS -- ISS- and SIMS-Analysis of Thin Organic Layers on Metal Surfaces -- New Developments in Spatially Multidimensional Ion Microprobe Analysis -- Investigation of Grain Boundary Segregation in
Iron-Base Alloys by Auger Electron Spectroscopy -- Characterization of Anodic Oxide Layers by Sputter Profiling with AES and XPS -- Investigations of Phosphate Coatings of Galvanized Steel Sheets by a Surface-Analytical Multi-Method
Approach -- Surface- and Microanalytical Investigations of the Chemical Constitution of the Grain Boundary Phase in Dense Silicon Nitride -- Analysis of Reactively Ion Plated Titanium-Nitride Films -- Quantitative Surface Analysis
Without Reference Samples -- Improved Methods of Quantitative Electron Probe Microanalysis of Carbon-?(?z) Compared to Other Methods -- Quantitative Electron Probe Microanalysis of Sputtered FeC Dry Lubrication Films -- Experimental
and ZAF Correction Aspects of Carbon Analysis in Steels: Application to the Carburization of Irradiated Uranium-Plutonium Carbide Fuel Pin Claddings -- Quantitative Electron Probe Microanalysis of Borides in Aluminium -- Microprobe
Measurements to Determine Phase Boundaries and Diffusion Paths in Ternary Phase Diagrams Taking a Cu-Ni-Al System as an Example -- Investigation of (Mo, W)C Mixed Carbides by Electron Probe Microanalysis and Kossel Technique -- X-Ray
Emission Spectroscopy by Means of Electron-Microprobe for the Determination of the Density of States with Binary Amorphous Alloys -- X-Ray Excited Fluorescence Spectroscopy Within SEM for Trace Analysis -- STEM-EDX Measurements on
Grain Boundary Phenomena of Sensitized Chrome-Nickel Steels -- Metallurgical Investigations of Microstructure and Behaviour of High-Alloyed Manganese-Chromium Austenitic Steels for Generator-Rotor Retaining Rings -- Analytical Electron
Microscopy for Interface Characterization — Corrosion of Concrete -- Electron Microscope Characterization of Highest-Coercivity Magnetic Materials -- Multi-Element Preconcentration from Technical Alloys -- Application of the Levitation
Melting Technique in the Investigations of Iron and Steel Making
ISBN:9783709139431
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Mikrochimica Acta, Proceedings of the 11th Colloquium on Metallurgical Analysis, Institute for Analytical Chemistry, Technical University in Vienna, November 3–5, 1982: 10
Keywords: Materials science , Analytical chemistry , Computer programming , Materials Science , Characterization and Evaluation of Materials , Analytical Chemistry , Programming Techniques
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1983-9783642871481:ONLINE Show nearby items on shelf
Title:Ion Formation from Organic Solids Proceedings of the Second International Conference Münster, Fed. Rep. of Germany September 7–9, 1982
Author(s):
Date:1983
Size:1 online resource (272 p.)
Note:10.1007/978-3-642-87148-1
Contents:1 Field Desorption -- 1.1 Principles of Field Desorption Mass Spectrometry (Review) -- 1.2 Analytical Application of Field Desorption Mass Spectrometry (Review) -- 2 252Cf-Plasma Desorption -- 2.1 High Energy Heavy-Ion Induced
Desorption (Review) -- 2.2 Secondary Ion Emission From Metals Under Fission Fragment Bombardment -- 2.3 Fast Heavy Ion Induced Desorption of Molecular Ions from Small Proteins -- 2.4 Problems in Standardization of 252Cf Fission
Fragment Induced Desorption Mass Spectrometry -- 3 Secondary Ion Mass Spectrometry (SIMS) Incuding FAB -- 3.1 Secondary Ion Mass Spectrometry of Organic Compounds (Review) -- 3.2 Fast Atom Bombardment (Review) -- 3.3 Changes in
Secondary Ion and Metastable Ion Mass Spectral Patterns with Experimental Conditions -- 3.4 Time-of-Flight Measurements of Metastable Decay -- 3.5 Design and Performance of a New Time-of-Flight Instrument for SIMS -- 3.6 Secondary Ion
Emission from Adsorption Layers on Nickel -- 3.7 Secondary Ion Emission from UHV-Deposited Amino Acid Overlayers on Metals -- 3.8 Temperature Dependence of Secondary Ion Emission from Phenylalanine -- 3.9 Matrix Effects on Internal
Energy in Desorption Ionization -- 3.10 Mass Spectrometry of Secondary Ions: Polymers, Plasticizers and Polycyclic Aromatic Hydrocarbons -- 3.11 SIMS Studies of Polymer Surfaces -- 3.12 A Comparative Study of Organic Polymers by SIMS
and FABMS -- 3.13 Use of a Cesium Primary Beam for Liquid SIMS Analysis of Bio-Organic Compounds -- 3.14 Fast Atom Bombardment Study of Glycerol Mass Spectra and Radiation Chemistry -- 3.15 The Use of FAB for the Solution of Difficult
Mass Spectral Problems -- 3.16 Biological and Medical Applications of Organic SIMS -- 3.17 Low and High Resolution FAB Applications in Positive and Negative Ionization Mode -- 4 Laser Induced Ion Formation -- 4.1 Laser Induced Ion
Formation from Organic Solids (Review) -- 4.2 Time Resolved Laser Desorption -- 4.3 New Developments in Laser Pulse Induced Field Desorption -- 4.4 Thermal Processes in Repetitive Laser Desorption Mass Spectrometry -- 4.5 Laser Mass
Spectrometry of Organic Compounds -- 4.6 LAMMA 1000, a New Reflection Mode Laser Microprobe Mass Analyzer, and Its Application to EDTA and Diolen® -- 4.7 Some Experiments on Laser Induced Cationization of Sucrose -- 4.8 Mass
Spectrometry of Organic Compounds (?2000 amu) and Tracing of Organic Molecules in Plant Tissue with LAMMA -- 5 Other Ion Formation Processes -- 5.1 Ion Emissions from Liquids (Review) -- 5.2 Fast Dust Particles as Primaries —
Comparison of Ion Formation with Other Techniques -- Index of Contributors
ISBN:9783642871481
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Chemical Physics: 25
Keywords: Chemistry , Organic chemistry , Physical chemistry , Chemistry , Physical Chemistry , Organic Chemistry
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1982-9783642474958:ONLINE Show nearby items on shelf
Title:Chemistry and Physics of Solid Surfaces IV
Author(s):
Date:1982
Size:1 online resource (496 p.)
Note:10.1007/978-3-642-47495-8
Contents:1. Development of Photoemission as a Tool for Surface Science: 1900–1980 -- 1.1 Introduction -- 1.2 The Einstein Era: 1900–1930 -- 1.3 The Period of Misguided Quantum Mechanics: 1930–1945 -- 1.4 The Development of the Correct
Fundamental Understanding of the Photoemission Process: 1945–1960 -- 1.5 The Development of Photoemission Spectroscopy: 1960–1970 -- 1.6 The Explosive Era in Which Photoemission Spectroscopy Was Successfully Applied to the Study of
Surfaces: 1970–1980 -- 1.7 Conclusions -- References -- 2. Auger Spectroscopy as a Probe of Valence Bonds and Bands -- 2.1 Introduction -- 2.2 Lineshape Description — One-Electron Model -- 2.2.1 Atomic Auger Matrix Elements -- 2.2.2
Local or Mulliken Populations -- 2.3 Localization -- 2.4 Screening -- 2.5 Outlook -- 2.5.1 ESD/PSD -- 2.5.2 AES in the Gas Phase and Chemisorbed Systems -- 2.5.3 AES in the Bulk and at Interfaces -- 2.6 Summary -- References -- 3. SIMS
of Reactive Surfaces -- 3.1 Introduction -- 3.2 Single Crystal Metal Surfaces -- 3.2.1 Characteristics of SIMS -- 3.2.2 CO and O2 on Ru{001} -- 3.2.3 Classical Dynamics Modelling -- 3.2.4 Structure from Angle Dependence -- 3.2.5
Reactive Intermediates -- 3.3 Molecular SIMS -- 3.3.1 SIMS of Molecular Solids -- 3.3.2 Thiophene on Silver -- 3.3.3 Inorganic Complexes -- 3.4 Complex Surfaces -- 3.4.1 Proximity -- 3.4.2 Prospects for Catalysis -- 3.5 Conclusions --
References -- 4. Chemisorption Investigated by Ellipsometry -- 4.1 Introduction -- 4.2 Principles of Ellipsometry -- 4.3 (Sub)Monolayer Models -- 4.4 Clean Metal Surfaces -- 4.5 Spectroscopic Ellipsometry of Overlayers -- 4.6 Kinetic
Studies of Chemisorption -- 4.6.1 Coverage Calibration -- 4.6.2 Initial Stages of Oxidation -- 4.6.3 Reactions of Adsorbed Oxygen -- References -- 5. The Implications for Surface Science of Doppler-Shift Laser Fluorescence Spectroscopy
-- 5.1 Introduction -- 5.2 Charge Transfer Processes at Surfaces -- 5.3 Laser Fluorescence Spectroscopic Measurements of Fluxes and Energy Distributions of Sputtered Particles -- References -- 6. Analytical Electron Microscopy in
Surface Science -- 6.1 Introduction -- 6.2 Analytical Electron Microscopy Techniques -- 6.3 Scanning Electron Microscopy of Surfaces -- 6.4 Surface Spectroscopies and Microscopy -- 6.4.1 Auger Electron Spectroscopy and Microscopy --
6.4.2 Secondary Electron Spectroscopy and Work Function Imaging -- 6.4.3 Photoemission and Energy-Loss Spectroscopy -- 6.5 Diffraction Techniques and Microscopy -- 6.5.1 Transmission Electron Diffraction and Microscopy -- 6.5.2 RHEED
and Reflection Microscopy -- 6.5.3 LEED and Low-Energy Microscopy -- References -- 7. He Diffraction as a Probe of Semiconductor Surface Structures -- 7.1 Introduction -- 7.2 Si{100}: Disordered Dimer Array -- 7.2.1 Si{100} Periodicity
-- 7.2.2 Diffraction Scans and Qualitative Features of the Si{100} Surface -- 7.2.3 Specular Intensities -- 7.2.4 Structural Models for Si{100} -- 7.3 GaAs {110} -- 7.3.1 Diffraction Scans -- 7.3.2 Specular Intensity Scans -- 7.3.3
Rigorous Calculation of Diffraction Intensities -- 7.3.4 The Original of the He/GaAs Potential -- 7.3.5 Computation of Rarified Charge Densities -- 7.3.6 Summary -- 7.4 Si{111} (7×7) -- 7.4.1 Diffraction Scans -- 7.4.2 Specular
Intensity Interference -- 7.4.3 A Model of the Si{111} (7×7) -- 7.4.4 Summary -- References -- 8. Studies of Adsorption at Well-Ordered Electrode Surfaces Using Low-Energy Electron Diffraction -- 8.1 Introduction -- 8.2 Thermodynamics
of Electrodeposition -- 8.3 Experimental Methods -- 8.4 Underpotential States of Hydrogen on Pt -- 8.4.1 Isotherms for Hydrogen on {111} and {100} Pt -- 8.4.2 Hydrogen at Stepped Surfaces -- 8.5 Underpotential States of Oxygen on Pt --
8.6 Underpotential States of Metals on Metals -- 8.7 Relation of the Underpotential State to the Chemisorbed State in Vacuum -- References -- 9. Low-Energy Electron Diffraction Studies of Physically Adsorbed Films -- 9.1 Introduction
-- 9.2 Background -- 9.3 LEED Instrument -- 9.4 Krypton on Graphite -- 9.5 Arçon on Graphite -- 9.5.1 Rotational Epitaxy of an Incommensurate Monolayer -- 9.5.2 Thermodynamics of an Incommensurate Monolayer -- 9.5.3 Overlayer-Substrate
Spacing for an Incommensurate Monolayer -- 9.6 Nitrogen on Graphite -- 9.7 Conclusions -- References -- 10. Monte Carlo Simulations of Chemisorbed Overlayers -- 10.1 Introduction -- 10.2 Motivation for Monte Carlo Simulation of Surface
Systems -- 10.2.1 Introduction to the Monte Carlo Method -- 10.2.2 Results Obtainable via Monte Carlo -- 10.2.3. Comparison to Other Methods for Treating Statistical Systems -- 10.3 Monte Carlo Methods for Lattice Gases P -- 10.3.1
Simulation Mode -- 10.3.2 Microscopic Dynamics -- 10.3.3 Order of Transitions -- 10.4 Monto Carlo Simulation Results -- 10.4.1 Square Lattice Simulations -- 10.4.2 Rectangular Lattice Simulations -- 10.4.3 Triangular Lattice
Simulations -- 10.4.4 Hexagonal Lattice Simulations -- 10.5 Summary and Discussion -- References -- 11. Critical Phenomena of Chemisorbed Overlayers -- 11.1 Introduction -- 11.2 Important Concepts -- 11.2.1 Lattice Gas Model -- 11.2.2
Critical Exponents and Scaling Laws -- 11.2.3 Corrections to Scaling -- 11.2.4 Crossover Phenomena [11.22] -- 11.2.5 Fisher Renormalization -- 11.3 Universality Classes for Atoms on a 2-d Lattice -- 11.3.1 Order Parameters P -- 11.3.2
Universality Classes -- 11.3.3 Landau Theory for Adlayers -- 11.3.4 Catalogue of Transitions -- 11.3.5 Percolation -- 11.4 LEED on Single Crystal Faces -- 11.4.1 Measurement of Exponents -- 11.4.2 Surface Defects -- 11.5 Case Study:
0/Ni{111} -- 11.6 Conclusions and Exhortations -- References -- 12. Structural Defects in Surfaces and Overlayers -- 12.1 Introduction -- 12.2 The Effect of Defects on the Intensity Distribution in Reciprocal Space -- 12.3 Surface
Defect Studies Using Low-Energy Electron Diffraction -- 12.4 Surface Defect Studies by Alternative Diffraction Techniques -- 12.5 Summary -- References -- 13. Some Theoretical Aspects of Metal Clusters, Surfaces, and Chemisorption --
13.1 Intrinsic Properties of Metal Clusters -- 13.1.1 Cluster Density of States -- 13.1.2 Cluster Magnetism -- 13.2 The Interaction of CO with Cu Clusters -- 13.2.1 Cu9C0 Calculations -- 13.2.2 Discussion of Core Level Spectra --
References -- 14. The Inelastic Scattering of Low-Energy Electrons by Surface Excitations Basic Mechanisms -- 14.1 Introduction -- 14.2 Small-Angle Dipole Scattering -- 14.3 Inelastic Electron Scattering from Surfaces with Large
Deflection Angles The Scattering by Dipole-Inactive Surface Vibrations -- References -- 15. Electronic Aspects of Adsorption Rates -- 15.1 Introduction -- 15.2 The Energy Distribution Function -- 15.3 Derivation of a Boson Formalism --
15.4 General Features of the Energy Distribution Function -- 15.5 Stochastic Description of the Sticking Process -- 15.6 Quantum-Mechanical Treatment of the Adsorbate Motion -- 15.7 Summary -- Appendix A -- References -- 16. Thermal
Desorption -- 16.1 Introduction -- 16.2 Critical Examination of the Usual Procedures -- 16.2.1 Short Description -- 16.2.2 Critique -- 16.3 Experimental Difficulties and Advances -- 16.4 Some Results and Discussion -- 16.5 Conclusions
-- References -- 17. Field Desorption and Photon-Induced Field Desorption -- 17.1 Introduction -- 17.2 Field Desorption and Thermal Desorption -- 17.3 Investigations in the Field Ion Microscope -- 17.4 Surface Reactions Investigated by
Field Pulse Techniques and Time-of-Flight Mass Spectrometry -- 17.5 Field Ion Appearance Spectroscopy -- 17.6 Electron-Stimulated Field Desorption -- 17.7 Photon-Induced Field Desorption -- 17.7.1 Instrumental Development -- 17.7.2
Electronic Excitation of Adparticles -- 17.7.3 Thermal Activation of Adparticles -- 17.7.4 Surface Diffusion -- 17.7.5 Formation of Complex Ions and Cluster Ions -- 17.8 Summary -- References -- 18. Segregation and Ordering at Alloy
Surfaces Studied by Low-Energy Ion Scattering -- 18.1 Introduction -- 18.2 Principles of Surface Segregation -- 18.2.1 General Remarks -- 18.2.2 Regular Solution Theory -- 18.2.3 Influence of Atom Size Difference -- 18.2.4 Miedema’s
Model -- 18.2.5 Bulk-Phase Diagram Rule -- 18.2.6 Long-Range Order and Segregation -- 18.3 Surface Composition Analysis -- 18.3.1 Low-Energy Ion Scattering -- 18.4 Experimental Results — LEIS -- 18.4.1 Polycrystalline Alloy Surfaces --
18.4.2 Single Crystal Surfaces -- 18.5 Conclusions -- References -- 19. The Effects of Internal Surface Chemistry on Metallurgical Properties -- 19.1 Introduction -- 19.2 Segregation to Solid-Solid Interfaces -- 19.2.1 Grain Boundaries
-- 19.2.2 Particle-Matrix Interfaces -- 19.2.3 Comparison with Surface Segregation -- 19.3 Applications -- 19.3.1 Temper Embrittlement of Steels -- 19.3.2 Ductile Fracture -- 19.3.3 Sensitization of Austenitic Stainless Steels --
19.3.4 Grain Growth -- 19.4 Summary -- References
ISBN:9783642474958
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Springer Series in Chemical Physics: 20
Keywords: Chemistry , Physical chemistry , Chemistry , Physical Chemistry
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1978-9781468428179:ONLINE Show nearby items on shelf
Title:Electron and Ion Spectroscopy of Solids
Author(s):
Date:1978
Size:1 online resource (475 p.)
Note:10.1007/978-1-4684-2817-9
Contents:Theory of Photoemission -- The Use of Synchrotron Radiation in UPS: Theory and Results -- Angle Resolved Photoemission: Theoretical Interpretation of Results -- Chemisorption and Catalysis on Metals: Applications of Surface
Spectroscopies -- X-Ray Photoelectron Spectroscopy of Solids -- Current Problems in Auger Electron Spectroscopy -- Studies of Adsorbate Electronic Structure Using Ion Neutralization and Photoemission Spectroscopies -- to Secondary Ion
Mass Spectrometry (SIMS) -- Author Index
ISBN:9781468428179
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:NATO Advanced Study Institutes Series, Series B: Physics: 32
Keywords: Physics , Solid state physics , Spectroscopy , Microscopy , Physics , Solid State Physics , Spectroscopy and Microscopy
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:SPRINGER-1978-9781461340331:ONLINE Show nearby items on shelf
Title:Environmental Pollutants Detection and Measurement
Author(s):
Date:1978
Size:1 online resource (500p p.)
Note:10.1007/978-1-4613-4033-1
Contents:Welcoming Remarks -- Welcome from the Department of Radiation Biology and Biophysics -- Session I: Specification of Analytical Problems -- Air Pollutant Monitoring: Or How to Improve on an Ouija Board -- The Strategy for Cleaning Up
Our Waters -- European Aspects of Environmental Research and Legislation -- The Whole Animal as an Assay System -- Session II: More Familiar Principles -- Analysis of Atmospheric Pollutants of Possible Importance in Human
Carcinogenesis -- Ion-Selective Electrodes -- Ultratrace Metals Analysis by Electrothermal Atomization Atomic Absorption — Present Technology and Potential Developments -- Tanker Tragedies: Identifying the Source and Determining the
Fate of Petroleum in the Marine Environment -- Water Pollution Studies Using Raman Spectroscopy -- Session III: Methods for Field Use -- Passive Sampling of Ambient and Work Place Atmospheres by Means of Gas Permeation -- The
Continuous Measurement of Sulfur-Containing Aerosols by Flame Photometry: A Laboratory Study -- Tunable Diode Laser Detection of Air Pollutants -- An Evaluation of Lasers for Ambient Air Pollution Measurement -- Session IV: High
Spatial Resolution Microprobe Methods -- Methods of Microprobe Analysis -- Analytical Transmission Electron Microscopy and its Application in Environmental Science -- Electron Energy Loss Spectroscopy: A New Microanalytical Tecnique?
-- Secondary Ion Mass Spectrometry for Particulate Analysis -- Surface Chemical Analysis of Particles by Auger Electron Spectroscopy and ESCA -- Session V: Physical Analytical Methods -- Size Measurement of Airborne Particulates by
Time-of-Flight Spectroscopy -- Continuous Mass Spectrometric Analysis of Environmental Pollutants Using Surface Ionization -- Observation of the Raman Effect from Small Single Particles: Its Use in the Chemical Identification of
Airborne Particulates -- X-Ray Analysis of Environmental Pollutants -- Modern Techniques of Activation Analysis for the Measurement of Environmental Trace Metals -- Participants
ISBN:9781461340331
Series:eBooks
Series:SpringerLink (Online service)
Series:Springer eBooks
Series:Environmental Science Research : 13
Keywords: Physics , Physics , Physics, general
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Full Text:Click here
Location: ONLINE

Cover
Image
Call number:QD96.S43S747::2016 Show nearby items on shelf
Title:Secondary ion mass spectrometry : applications for depth profiling and surface characterization
Author(s): F. A. Stevie
Date:2016
Publisher:New York : Momentum Press
Size:262 p
Contents:Comparison of surface analytical techniques -- SIMS technique -- Analysis parameters -- Instrumentation - Depth profiling (Dynamic SIMS) -- Quantification -- Surfaces, interfaces, multilayers, bulk -- Insulators -- Residual and rare gas elements -- Applications -- Analysis approach
ISBN:9781606505885
Keywords: Materials science , Secondary ion mass spectrometry
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Location: MAIN

Cover
Image
Call number:QD96.S43F43::2015 Show nearby items on shelf
Title:An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science
Author(s): Sarah Fearn
Date:2015
Publisher:Morgan & Claypool Publishers
Size:various p
Contents:Preface -- Author biography -- 1. Introduction -- 1.1. Overview -- 1.2. Basic principles -- 2. Practical requirements -- 2.1. Ion generation -- 2.2. Primary and sputter ion beam sources -- 2.3. Mass analysis -- 2.4. Ion detection -- 2.5. Ultra high vacuum -- 3. Modes of analysis -- 3.1. High-resolution mass spectra -- 3.2. Depth profiling -- 4. Ion beam-target interactions -- 4.1. Ion beam induced atomic mixing -- 4.2. Beam induced surface roughening and uneven etching -- 4.3. Beam induced segregati on -- 4.4. Other beam induced effects -- 4.5. Depth profiling with cluster ion beams -- 5. Application to materials science -- 5.1. Biomaterials and tissue studies -- 5.2. Glass corrosion -- 5.3. Ceramic oxides -- 5.4. Semiconductor analysis -- 5.5. Organ ic electronics -- 6. Summary.
ISBN:9781681740249
Keywords: Materials science , Secondary ion mass spectrometry , Time-of-flight mass spectrometry
Availability:Click here to see Library holdings or inquire at Circ Desk (x3401)
Click to reserve this book Be sure to include your ID please.
More info:Amazon.com
More info: Barnes and Noble
Location: NEW

Return to the Fermilab Library catalog